The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2018

Filed:

Nov. 29, 2016
Applicant:

Anritsu Corporation, Kanagawa, JP;

Inventors:

Taichi Murakami, Kanagawa, JP;

Yasuhiro Miyake, Kangawa, JP;

Assignee:

ANRITSU CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/0485 (2013.01); G01M 11/00 (2006.01); G06F 3/0481 (2013.01); G06F 3/0488 (2013.01);
U.S. Cl.
CPC ...
G06F 3/0485 (2013.01); G01M 11/3109 (2013.01); G06F 3/04817 (2013.01); G06F 3/04883 (2013.01);
Abstract

An optical time domain reflectometer includes: an OTDR measurement unit; an event detection unit that detects an event using the measurement result of the OTDR measurement unit; a display unit that displays a plurality of icons indicating events in an event display region Aand displays information of an event, which is located in a specific region Aof the event display region A, in an information display region A; an operation detection unit that detects a swipe operation in the event display region A; and an event-of-interest changing unit that scrolls the events displayed in the event display region Aaccording to the swipe operation to change the display of the information display region Ato information corresponding to the event indicated by the icon located in the specific region A.


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