The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2018
Filed:
Jul. 18, 2014
Synopsys, Inc., Mountain View, CA (US);
Anshuman Chandra, Sunnyvale, CA (US);
Subramanian Chebiyam, Sunnyvale, CA (US);
Jyotirmoy Saikia, Bangalore, IN;
Parthajit Bhattacharya, Bangalore, IN;
Rohit Kapur, Cupertino, CA (US);
Synopsys, Inc., Mountain View, CA (US);
Abstract
A method for masking scan chains in a test circuit of an integrated circuit is disclosed. The test circuit includes multiple mask banks. Different mask patterns are stored in each of the mask banks. A first mask bank of the multiple mask banks is selected and the mask pattern stored in the selected first mask bank is used for masking the output of the scan chains of the test circuit during a first portion of a test cycle. A second mask bank of the multiple mask banks is selected and the ask pattern stored in the selected second mask bank is used for masking the output of the scan chains of the test circuit during a second portion of the test cycle.