The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2018
Filed:
Mar. 24, 2015
Applicant:
Intel Corporation, Santa Clara, CA (US);
Inventors:
Sankaran M. Menon, Austin, TX (US);
Vasudev Bibikar, Austin, TX (US);
Assignee:
INTEL CORPORATION, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/58 (2006.01); G01R 31/26 (2014.01); G06F 1/32 (2006.01); H01L 21/66 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2637 (2013.01); G06F 1/3203 (2013.01); H01L 22/34 (2013.01); H01L 23/58 (2013.01);
Abstract
A method and apparatus (e.g., semiconductor device) for setting voltages (e.g., guardbands) using 'in situ,' or on-die, silicon measurements are described. In one embodiment the semiconductor device comprises: a process monitor to measure silicon parameters of the semiconductor device; and a controller coupled to the process monitor to set a voltage for use on at least a portion of the semiconductor device based on silicon process monitor measurements.