The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2018

Filed:

Oct. 27, 2016
Applicant:

Globalfoundries Inc., Grand Cayman, KY;

Inventors:

Andres Bryant, Burlington, VT (US);

Jeffrey B. Johnson, Essex Junction, VT (US);

Effendi Leobandung, Stormville, NY (US);

Tenko Yamashita, Schenectady, NY (US);

Assignee:

GLOBALFOUNDRIES Inc., Grand Cayman, KY;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/12 (2006.01); H01L 29/66 (2006.01); H01L 29/78 (2006.01); H01L 29/06 (2006.01); H01L 29/16 (2006.01); H01L 29/45 (2006.01); H01L 29/51 (2006.01);
U.S. Cl.
CPC ...
H01L 27/1211 (2013.01); H01L 29/0649 (2013.01); H01L 29/16 (2013.01); H01L 29/456 (2013.01); H01L 29/517 (2013.01); H01L 29/66545 (2013.01); H01L 29/66795 (2013.01); H01L 29/785 (2013.01);
Abstract

A method for fabricating a FinFET device includes forming a silicon-on-insulator (SOI) substrate having a semiconductor layer overlaying a buried oxide (BOX) layer; etching the semiconductor layer to form a plurality of fin structures and a semiconductor layer gap in between the plurality of fin structures and the BOX layer; depositing a sacrificial gate over at least one gate region, wherein the gate region separates a source and a drain region; disposing offset spacers on vertical sidewalls of the sacrificial gate; removing the sacrificial gate; removing the semiconductor layer gap in the gate region to prevent merging of the plurality of fin structures in the gate regions; and fabricating a high-k dielectric metal gate structure overlaying the fin structures in the gate region.


Find Patent Forward Citations

Loading…