The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2018

Filed:

Mar. 01, 2016
Applicant:

Namlab Ggmbh, Dresden, DE;

Inventors:

Uwe Schröder, Dresden, DE;

Milan Pe{hacek over (s)}ić, Dresden, DE;

Assignee:

NaMLab gGmbH, Dresden, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/115 (2017.01); H01L 29/51 (2006.01); H01L 29/78 (2006.01); H01L 49/02 (2006.01); G11C 11/56 (2006.01); G11C 11/24 (2006.01); G11C 11/22 (2006.01); G11C 13/00 (2006.01); H01L 27/11507 (2017.01);
U.S. Cl.
CPC ...
H01L 27/11507 (2013.01); G11C 11/2273 (2013.01); G11C 11/2275 (2013.01); G11C 11/24 (2013.01); G11C 11/5657 (2013.01); G11C 13/0007 (2013.01); H01L 28/56 (2013.01); H01L 29/516 (2013.01); H01L 29/78391 (2014.09);
Abstract

Integrated devices comprising pinched hysteresis loop (PHL) materials in a capacitor or a transistor stack are disclosed. PHL materials include field induced ferroelectrics (FFE), anti-ferroelectric (AFE) and relaxor type ferroelectric (RFE) materials. Each integrated device includes a material stack with a PHL material layer disposed between two electrodes. Application of this material is dependent on inducing of an electric field bias over the stack. According to one option, electrodes having different workfunction values can be employed to induce the required built-in bias field and enable use of PHL materials. According to another option, a PHL material and charges, e.g., a charge interlayer, are disposed between two electrodes such that an induced built-in bias field appears. Integrated devices employing the PHL material stack include memories, transistors, and piezo- and pyroelectric devices.


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