The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2018
Filed:
Feb. 06, 2015
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventor:
Rolf Wartmann, Waake, DE;
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/02 (2006.01); G02B 13/14 (2006.01); G02B 27/00 (2006.01); G02B 9/62 (2006.01);
U.S. Cl.
CPC ...
G02B 21/02 (2013.01); G02B 13/143 (2013.01); G02B 27/0025 (2013.01); G02B 9/62 (2013.01);
Abstract
An apochromatic microscope objective, including three optical sub-systems, wherein starting from the object plane, the first sub-system includes a meniscus and a convergent lens, wherein the meniscus is curved towards the object plane, the second sub-system is made up of three elements, wherein a first element includes a meniscus or a cemented element, a second element is configured as a collecting cemented element and a third element is a cemented element, and wherein either the first element or the third element is strongly scattering and the third sub-system has at least one cemented element with a collecting lens.