The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2018

Filed:

Dec. 02, 2014
Applicant:

Mpi Corporation, Zhubei, TW;

Inventors:

Wei-Cheng Ku, Zhubei, TW;

Hao Wei, Zhubei, TW;

Chia-Nan Chou, Zhubei, TW;

Chih-Hao Ho, Zhubei, TW;

Assignee:

MPI CORPORATION, Zhubei, TW;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/04 (2006.01); G01R 1/04 (2006.01);
U.S. Cl.
CPC ...
G01R 31/041 (2013.01); G01R 1/0466 (2013.01);
Abstract

A testing jig includes a substrate and a plurality of conductive elastic pieces, wherein the substrate has a recess and a plurality of circuits; the recess is located on a top surface of the substrate, while the circuits are provided on the top surface of the substrate. The conductive elastic pieces are provided on the substrate, and are respectively electrically connected to the circuits. Each of the conductive elastic pieces has a contact portion located within an orthographic projection range of the recess, wherein each of the contact portions contacts a pad of a DUT. Whereby, attenuation happens while transmitting test signals with high frequency can be effectively reduces by using the conductive elastic pieces to transmit test signals.


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