The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2018
Filed:
Oct. 28, 2016
Beihang University, Beijing, CN;
BEIHANG UNIVERSITY, Beijing, CN;
Abstract
The invention provides a line guided 3D model reshaping method, including: 1. extracting a contour of an object from an image, and selecting a contour or main skeleton to create a 2D line database; 2. extracting a 3D editable line, retrieving and suggesting an appropriate 2D contour or skeleton from 2D line database; 3. establishing point-to-point correspondence by matching 2D contour or skeleton to 3D editable line, and reshaping the model using parametric deformation method. By the method, 2D contour or skeleton appropriate for 3D model editable line is automatically suggested from 2D line database of multiple classes of objects to guide 3D model reshaping, and fewer user interactions are required in extracting from input 3D model editable lines such as axes, cross-sections and outlines and producing various types of reshaped models by using parametric deformation method, thereby helping user to design desirable 3D model with speed and ease.