The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2018
Filed:
Nov. 13, 2014
Carl Zeiss Microscopy Gmbh, Jena, DE;
Marco Pretorius, Oberkochen, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
An arrangement for light sheet microscopy including illumination optics with an illumination objective for illuminating a sample, located in a medium on a sample carrier aligned with respect to a plane reference surface, with a light sheet. The arrangement further includes detection optics with a detection objective. The arrangement also includes a separating layer system with at least one layer separating the medium from the illumination and detection objectives. The separating layer system is aligned with a base surface parallel to the reference surface and contacts the medium by this base surface. At least one detection corrective lens, for reducing those aberrations occurring as a result of light to be detected passing obliquely through interfaces of the separating layer system, is configured as free-form lens and is arranged between the detection objective and the separating layer system. Alternatively, it also forms the front lens of the detection objective.