The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2018
Filed:
May. 24, 2016
Applicant:
Carl Zeiss Microscopy, Llc, Thornwood, NY (US);
Inventors:
Sybren J. Sijbrandij, Wakefield, MA (US);
John A. Notte, IV, Gloucester, MA (US);
Raymond Hill, Rowley, MA (US);
Assignee:
Carl Zeiss Microscopy, LLC, Thornwood, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 37/05 (2006.01); H01J 37/244 (2006.01);
U.S. Cl.
CPC ...
H01J 37/05 (2013.01); H01J 37/244 (2013.01); H01J 2237/2443 (2013.01); H01J 2237/2445 (2013.01); H01J 2237/2448 (2013.01); H01J 2237/24435 (2013.01); H01J 2237/24495 (2013.01); H01J 2237/24564 (2013.01);
Abstract
A charged particle detecting device includes: a holding structure; a first charged particle detector at the terminal portion of the holding structure; a second charged particle detector at the terminal portion of the holding structure; a detector head at the terminal portion of the holding structure; and a first electrode which is transmissive for the first and second species of charged particles covering an entrance opening of the detector head.