The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2018
Filed:
Apr. 10, 2014
Applicant:
Hitachi High-technologies Corporation, Minato-ku, Tokyo, JP;
Inventors:
Hiroyuki Satake, Tokyo, JP;
Yuichiro Hashimoto, Tokyo, JP;
Masao Suga, Tokyo, JP;
Hideki Hasegawa, Tokyo, JP;
Assignee:
Hitachi High-Technologies Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 30/72 (2006.01); G01N 27/62 (2006.01); H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
G01N 30/7233 (2013.01); G01N 27/624 (2013.01); H01J 49/004 (2013.01); H01J 49/0027 (2013.01);
Abstract
An analysis system is provided with: a storage unit that stores first information associating mass spectrometry result information with an analysis condition concerning ion mobility separation; and a control unit that determines, as a first analysis condition for an ion to be measured, the analysis condition associated with the mass spectrometry result information of the first information corresponding to the mass spectrometry result information of the ion to be measured.