The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2018
Filed:
Feb. 13, 2017
SK Hynix Inc., Gyeonggi-do, KR;
Aman Bhatia, San Jose, CA (US);
Wei-Hao Yuan, San Jose, CA (US);
Yi-Min Lin, San Jose, CA (US);
Naveen Kumar, San Jose, CA (US);
Fan Zhang, San Jose, CA (US);
Johnson Yen, Fremont, CA (US);
SK Hynix Inc., Gyeongi-do, KR;
Abstract
Techniques are described for optimizing a parity-check matrix for a low density parity check (LDPC) encoder. In an example, a first parity-check matrix is accessed. Based on a set of rules, an independent set of check nodes and variable nodes is determined. The set of rules specifies that a check node associated with the first parity-check matrix belongs to the independent set when the check node is connected to only one variable node from the independent set. The set of rules further specifies that a variable node associated with the first parity-check matrix belongs to the independent set when the variable node is connected to only one check node from the independent set. A size of the independent set is based on the set of rules. A second parity-check matrix is generated by at least applying a permutation to the first parity-check matrix based on the independent set.