The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 2018

Filed:

Apr. 17, 2017
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsin-Chu, TW;

Inventors:

Yu-Lien Huang, Hsinchu County, TW;

Li-Te Lin, Hsinchu, TW;

Yuan-Hung Chiu, Taipei, TW;

Han-Yu Lin, Hsin-Chu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01); H01L 21/00 (2006.01); H01L 21/02 (2006.01); H01L 21/04 (2006.01); H01L 21/28 (2006.01); H01L 29/08 (2006.01);
U.S. Cl.
CPC ...
H01L 29/66583 (2013.01); H01L 21/02642 (2013.01); H01L 21/0465 (2013.01); H01L 21/28247 (2013.01); H01L 29/0847 (2013.01); H01L 29/6656 (2013.01); H01L 29/66545 (2013.01); H01L 2224/0348 (2013.01); H01L 2224/03916 (2013.01);
Abstract

A method includes forming a first gate structure in a dielectric layer over a substrate, wherein the first gate structure includes a first gate stack and spacers along sidewalls of the first gate stack; recessing the first gate stack to form a first trench defined by the spacers, wherein upper portions of the spacers are exposed within the first trench; forming a first capping layer in the first trench, wherein the first capping layer has a first portion disposed along sidewalls of the upper portions of the spacers and a second portion disposed over the recessed first gate stack; applying a first implantation to convert the second portion of the first capping layer into a second capping layer; selectively removing the first portion of the capping layer to expose the upper portions of the spacers; and selectively removing the upper portions of the spacers.


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