The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2018
Filed:
Apr. 22, 2016
Carl Zeiss Microscopy Gmbh, Jena, DE;
Kai Wicker, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
An arrangement for correcting aberrations of a specimen surface that vary across the visual field on a microscope, including a lens, a tubular lens, an imaging optics element, a pupil stop disposed in the beam path, and at least one optical element for optical-geometric separation of different image field regions. The optical element for optical-geometric separation of different image field regions is arranged in or near the intermediate image plane. Each individual element of the optical element for optical-geometric separation of different image field regions performs a pupil imaging, defined by the dimensions of the covered area of the intermediate image, such that a distribution of sub-pupils occurs, wherein each sub-pupil is allocated to the angle distribution from the associated image field region.