The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 2018

Filed:

Oct. 16, 2014
Applicant:

Hitachi High-technologies Corporation, Tokyo, JP;

Inventors:

Michiru Fujioka, Tokyo, JP;

Tsuyoshi Sonehara, Tokyo, JP;

Naoshi Itabashi, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01); G01N 21/65 (2006.01); G01N 33/487 (2006.01); G01Q 60/22 (2010.01); G11B 23/03 (2006.01); G11B 7/08 (2006.01); G11B 7/1387 (2012.01); G11B 7/085 (2006.01); G11B 7/22 (2006.01);
U.S. Cl.
CPC ...
G01N 21/658 (2013.01); G01N 33/48721 (2013.01); G01Q 60/22 (2013.01); G11B 7/08 (2013.01); G11B 7/1387 (2013.01); G11B 23/0318 (2013.01); G11B 7/08576 (2013.01); G11B 7/22 (2013.01);
Abstract

The purpose of the present invention is to control, with a simple structure and high accuracy, irradiation of excitation light to a multi-nanopore substrate without interrupting a measurement. Irradiation of excitation light is performed concurrently to at least one nanopore and at least one reference object on a substrate mounted in an observation containerA position irradiated with the excitation light in a measurement sample is calculated on the basis of a signal generated from the reference object detected by a detectorand the measurement and a fixed position control is performed concurrently by performing measurement of the measurement object while a drive control partcontrolling the position of the irradiation of the excitation light to the measurement sample on the basis of the calculation result, whereby an analysis of the measurement sample can be performed in a short time.


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