The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2018

Filed:

Nov. 12, 2014
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Erik Colban, San Diego, CA (US);

David Gell, San Diego, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 4/00 (2018.01); H04W 48/20 (2009.01); H04W 48/14 (2009.01); H04W 24/08 (2009.01); H04W 48/16 (2009.01); H04W 48/00 (2009.01); H04W 48/18 (2009.01); H04W 84/12 (2009.01);
U.S. Cl.
CPC ...
H04W 48/20 (2013.01); H04W 24/08 (2013.01); H04W 48/14 (2013.01); H04W 48/16 (2013.01); H04W 48/17 (2013.01); H04W 48/18 (2013.01); H04W 84/12 (2013.01);
Abstract

A method, wireless device and computer program product determine a recommended access point (AP) for the wireless device to access a wireless network. AP feature values associated with each one of a plurality of APs within an access range of the wireless device and user feature values associated with identified user features of a user of the wireless device are obtained via a wireless interface. A predicted score for each AP is determined based on the feature values and a recommended AP is determined based on the predicted scores. The wireless device connects to the wireless network based at least in part on the recommended AP. AP feature values include AP characteristic, scheduling and payment values. User features include wireless device location and velocity, services-in-use, time of day and day of week. Optionally, circumstantial feature values may be obtained and used to determine the predicted scores.


Find Patent Forward Citations

Loading…