The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2018

Filed:

May. 11, 2017
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Ron Kimmel, Haifa, IL;

Barak Freedman, Yokneam, IL;

Alex Bronstein, Haifa, IL;

Michael Bronstein, Lugano, CH;

Sagi Ben Moshe, Kiryat Byalik, IL;

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/00 (2018.01); H04N 13/02 (2006.01); H04N 5/33 (2006.01); G06T 7/80 (2017.01); G06T 7/521 (2017.01); H04N 5/225 (2006.01); H04N 5/357 (2011.01);
U.S. Cl.
CPC ...
H04N 13/0246 (2013.01); G06T 7/521 (2017.01); G06T 7/80 (2017.01); H04N 5/2256 (2013.01); H04N 5/33 (2013.01); H04N 5/332 (2013.01); H04N 5/357 (2013.01); H04N 13/0051 (2013.01); H04N 13/025 (2013.01); H04N 13/0239 (2013.01); H04N 13/0253 (2013.01); H04N 13/0296 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/10048 (2013.01);
Abstract

Embodiments of the present disclosure provide techniques and configurations for an optoelectronic three-dimensional object acquisition assembly configured to correct image distortions. In one instance, the assembly may comprise a first device configured to project a light pattern on an object at a determined angle; a second device configured to capture a first image of the object illuminated with the projected light pattern; a third device configured to capture a second image of the object; and a controller coupled to the first, second, and third devices and configured to reconstruct an image of the object from geometric parameters of the object obtained from the first image, and to correct distortions in the reconstructed image caused by a variation of the determined angle of the light pattern projection, based at least in part on the first and second images of the object. Other embodiments may be described and/or claimed.


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