The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2018
Filed:
Jun. 26, 2017
Applicant:
Xilinx, Inc., San Jose, CA (US);
Inventor:
James D. Wesselkamper, Albuquerque, NM (US);
Assignee:
XILINX, INC., San Jose, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 9/32 (2006.01); H03K 19/003 (2006.01); G11C 29/52 (2006.01); G11C 29/06 (2006.01); G11C 11/41 (2006.01);
U.S. Cl.
CPC ...
H04L 9/3278 (2013.01); G11C 11/41 (2013.01); G11C 29/06 (2013.01); G11C 29/52 (2013.01); H03K 19/003 (2013.01); H04L 2209/12 (2013.01);
Abstract
A method of generating a physically unclonable function is described. The method comprises calculating a total variation associated with differences between a plurality of elements of an entropy source in an integrated circuit; calculating a global variation associated the plurality of elements of the entropy source; generating a local variation by removing the global variation associated with the plurality of elements from the total variation; and generating a unique signature based upon the generated local variation. A circuit for generating a physically unclonable function is also described.