The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2018

Filed:

Jun. 30, 2015
Applicant:

Keysight Technologies, Inc., Minneapolis, MN (US);

Inventors:

Kurt Stephen Werder, Pleasanton, CA (US);

Lawrence P. Muray, Moraga, CA (US);

James P. Spallas, San Ramon, CA (US);

William Daniel Meisburger, San Jose, CA (US);

Assignee:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/00 (2006.01); H01J 37/29 (2006.01); H01J 37/20 (2006.01); H01J 37/22 (2006.01); H01J 37/02 (2006.01); H01L 21/66 (2006.01);
U.S. Cl.
CPC ...
H01J 37/292 (2013.01); H01J 37/023 (2013.01); H01J 37/20 (2013.01); H01J 37/222 (2013.01); H01L 22/00 (2013.01); H01J 2237/0245 (2013.01); H01J 2237/20228 (2013.01); H01J 2237/2817 (2013.01);
Abstract

An apparatus for inspecting a substrate is described. The apparatus includes an X-Y stage that supports a substrate to be inspected and is operable to move a substrate supported thereby in X and Y directions; and an imaging system including a plurality of beam columns operable to irradiate regions of a substrate supported by the X-Y stage with beams of energy, respectively, discrete from one another. Respective ones of the beam columns are movable relative to others of the electron beam columns.


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