The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2018

Filed:

Aug. 17, 2016
Applicant:

Winbond Electronics Corp., Taichung, TW;

Inventor:

Kazuki Yamauchi, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/14 (2006.01); G06F 11/10 (2006.01); G11C 16/26 (2006.01); G11C 16/34 (2006.01); G11C 29/44 (2006.01); G11C 16/10 (2006.01); G11C 16/16 (2006.01); G11C 16/04 (2006.01); G11C 29/52 (2006.01); G11C 7/20 (2006.01); G11C 29/42 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
G11C 16/14 (2013.01); G06F 11/1068 (2013.01); G11C 16/10 (2013.01); G11C 16/16 (2013.01); G11C 16/26 (2013.01); G11C 16/3445 (2013.01); G11C 16/3459 (2013.01); G11C 29/44 (2013.01); G11C 7/20 (2013.01); G11C 16/0483 (2013.01); G11C 29/42 (2013.01); G11C 29/52 (2013.01); G11C 2029/0409 (2013.01);
Abstract

A semiconductor memory device, an erasing method and a programming method are provided. The semiconductor memory device includes a memory array, which includes a plurality of NAND strings; a page buffer/sensing circuit, which is connected to the NAND strings of the memory array through bit lines and outputs whether the NAND strings include failures; and a detecting circuit, which is connected to the plurality of page buffer/sensing circuits and detects a number of the failures among the NAND strings of a selected block. The block is determined to be usable when the number of the failures among the NAND strings detected by the detecting circuit is less than or equal to a fixed number, and the block is determined to be unusable as a bad block when the number of the failures exceeds the fixed number.


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