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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10024719 B1

PDFFull Text
Expired
Date of Patent:
Jul. 17, 2018

Filed:

Jun. 13, 2014

Measurement object, method for the production thereof and device for the thermal treatment of substrates

Applicant:

Centrotherm Photovoltaics Ag, Blaubeuren, DE;

Inventors:

Dieter Zernickel, Amstetten, DE;

Steffen Mueller, Ulm, DE;

Assignee:

CENTROTHERM PHOTOVOLTAICS AG, , DE;

Attorney:

Tarolli, Sundheim, Covell & Tummino LLP

Primary Examiner:

Mirellys Jagan

Int. Cl.
CPC ...
G01J 5/00 (2006.01); G01K 13/00 (2006.01); G01J 5/08 (2006.01); G01J 5/52 (2006.01); H01L 21/67 (2006.01); H01L 21/687 (2006.01); F28F 13/18 (2006.01);
U.S. Cl.
CPC ...
G01J 5/08 (2013.01); G01J 5/0007 (2013.01); G01J 5/0887 (2013.01); G01J 5/522 (2013.01); H01L 21/67115 (2013.01); H01L 21/6875 (2013.01); H01L 21/68735 (2013.01); F28F 13/185 (2013.01);
Abstract

A measuring object for use in a heating apparatus for the thermal treatment of substrates is described, wherein the measuring object is the substrate to be treated or an object which in use has a substantially known temperature relation to the substrate to be treated, wherein the measuring object comprises a surface having at least one surface area, which acts as a measuring surface for an optical temperature measurement. A predetermined structure in the form of a plurality of recessions is formed in the surface area, in order to influence the emissivity of the surface area.

Find Patent Forward Citations

Zernickel, Dieter. (2018). Measurement object, method for the production thereof and device for the thermal treatment of substrates (U.S. Patent No. 10024719). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10024719

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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