The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2018
Filed:
Aug. 10, 2012
Applicants:
Kazuhiko Yamasaki, Naka-gun, JP;
Yoshiaki Takata, Naka-gun, JP;
Toshiharu Hayashi, Naka-gun, JP;
Inventors:
Assignee:
MITSUBISHI MATERIALS CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 31/04 (2014.01); G02B 5/08 (2006.01); H01L 31/0224 (2006.01); H01L 31/056 (2014.01); B82Y 20/00 (2011.01); B82Y 30/00 (2011.01); H01B 1/22 (2006.01); H01L 31/0352 (2006.01);
U.S. Cl.
CPC ...
H01L 31/04 (2013.01); B82Y 20/00 (2013.01); B82Y 30/00 (2013.01); G02B 5/0808 (2013.01); H01B 1/22 (2013.01); H01L 31/022425 (2013.01); H01L 31/0352 (2013.01); H01L 31/056 (2014.12); Y02E 10/52 (2013.01); Y10T 428/24997 (2015.04); Y10T 428/249978 (2015.04); Y10T 428/249979 (2015.04);
Abstract
A conductive reflective film which is formed by calcining a substrate on which a composition containing metal nanoparticles is coated, the conductive reflective film including pores which appear on the film contact surface in the substrate side having an average diameter of 100 nm or less, an average depth of 100 nm or less in terms of position of the pores, and a number density of the pores of 30 pores/μmor less.