The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2018

Filed:

Nov. 08, 2013
Applicants:

Dirk Heisswolf, Munich, DE;

Andreas Ralph Pachl, Neubiberg, DE;

Rafael Pena Bello, Munich, DE;

Inventors:

Dirk Heisswolf, Munich, DE;

Andreas Ralph Pachl, Neubiberg, DE;

Rafael Pena Bello, Munich, DE;

Assignee:

NXP USA, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 13/24 (2006.01); G06F 9/46 (2006.01); G06F 13/26 (2006.01); G06F 9/30 (2018.01);
U.S. Cl.
CPC ...
G06F 13/26 (2013.01); G06F 9/30 (2013.01); G06F 13/24 (2013.01);
Abstract

The invention provides a processing system, comprising a memory comprising a processor call stack; a stack space usage register configured to determine the stack space usage of the processor call stack and to store a usage parameter indicative of the determined stack space usage; a first threshold register configured to store a pre-determinable first stack level threshold; and a first comparator configured to compare the usage parameter with the first stack level threshold and to output a first interrupt blocking signal, if the usage parameter exceeds the first stack level threshold, the first interrupt blocking signal being configured to block the decoding of interrupt signals input to the processing system and having interrupt priorities lower than or equal to or just lower than a first interrupt priority threshold. The invention further provides a method for stack management, especially in a processing system.


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