The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2018

Filed:

May. 11, 2017
Applicant:

Veeco Instruments Inc., Plainview, NY (US);

Inventors:

Boris Druz, Brooklyn, NY (US);

Rustam Yevtukhov, Briarwood, NY (US);

Rhodri Elliott, Ann Arbor, MI (US);

James M. Best, Jr., Huntington, NY (US);

Peter Porshnev, Northport, NY (US);

Assignee:

Veeco Instruments Inc., Plainview, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/36 (2006.01); H01J 37/30 (2006.01); G01R 19/165 (2006.01); H01J 37/32 (2006.01);
U.S. Cl.
CPC ...
H01J 37/36 (2013.01); G01R 19/16533 (2013.01); H01J 37/3007 (2013.01); H01J 37/32018 (2013.01); H01J 37/32944 (2013.01); H01J 2237/18 (2013.01); H01J 2237/335 (2013.01);
Abstract

Embodiments relate to a grid short clearing system is provided for gridded ion beam sources used in industrial applications for materials processing systems that reduces grid damage during operation. In various embodiments, the ion source is coupled to a process chamber and a grid short clearing system includes methods for supplying a gas to the process chamber and setting the gas pressure to a predetermined gas pressure in the range between 50 to 750 Torr, applying an electrical potential difference between each adjacent pair of grids using a current-limited power supply, and detecting whether or not the grid shorts are cleared. The electrical potential difference between the grids is at least 10% lower than the DC electrical breakdown voltage between the grids with no contaminants.


Find Patent Forward Citations

Druz, Boris. (2018). Ion beam materials processing system with grid short clearing system for gridded ion beam source (U.S. Patent No. 10014164). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10014164

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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