The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2018

Filed:

Feb. 04, 2016
Applicant:

Hitachi High-technologies Corporation, Minato-ku, Tokyo, JP;

Inventors:

Yuta Imai, Tokyo, JP;

Hideo Morishita, Tokyo, JP;

Toshihide Agemura, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/12 (2006.01); H01J 37/28 (2006.01); H01J 37/06 (2006.01); H01J 37/20 (2006.01); H01J 37/08 (2006.01);
U.S. Cl.
CPC ...
H01J 37/12 (2013.01); H01J 37/06 (2013.01); H01J 37/08 (2013.01); H01J 37/20 (2013.01); H01J 37/28 (2013.01); H01J 2237/08 (2013.01); H01J 2237/2801 (2013.01);
Abstract

This composite charged particle beam device comprises a first charged particle beam column (), a second charged particle beam column () which is equipped with a deceleration system, and is equipped with a detector () inside the column, a test piece stage () on which a test piece () is placed, and an electric field correction electrode () which is provided around the tip of the first charged particle beam column, wherein the electric field correction electrode is an electrode that corrects the electric field distribution formed in the vicinity of the test piece, and the electric field correction electrode is positioned between the test piece and the first charged particle beam column, and on the opposite side from the second charged particle beam column with respect to the optical axis of the first charged particle beam column.


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