The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2018
Filed:
Aug. 17, 2016
Applicant:
Freescale Semiconductor, Inc., Austin, TX (US);
Inventor:
Andrew C. Russell, Austin, TX (US);
Assignee:
NXP USA, Inc., Austin, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G06F 3/06 (2006.01); G06F 11/10 (2006.01); G11C 29/52 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0619 (2013.01); G06F 3/064 (2013.01); G06F 3/0683 (2013.01); G06F 11/1004 (2013.01); G06F 11/1072 (2013.01); G11C 29/52 (2013.01);
Abstract
An integrated circuit (IC) device including a first memory device, a second memory device stacked with the first memory device, and one or more memory controllers configured to detect a first error in data stored in the first memory device at a first physical location in the IC device, and upon detecting the first error, determine whether there is a second error in data stored in the second memory device in a second physical location in the IC device near the first physical location.