The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2018

Filed:

Aug. 15, 2016
Applicant:

Sandisk Technologies Llc, Plano, TX (US);

Inventors:

Deepak Raghu, San Jose, CA (US);

Pao-Ling Koh, Fremont, CA (US);

Philip Reusswig, Mountain View, CA (US);

Chris Nga Yee Yip, Sunnyvale, CA (US);

Jun Wan, San Jose, CA (US);

Yan Li, Milpitas, CA (US);

Assignee:

SanDisk Technologies LLC, Plano, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/04 (2006.01); G06F 1/20 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 1/206 (2013.01); G06F 3/0616 (2013.01); G06F 3/0653 (2013.01); G06F 3/0688 (2013.01);
Abstract

A storage device with a memory may modify throttling to reduce cross temperature effects. The decision to throttle may be based on a memory device temperature (i.e. temperature throttling) or may be based on the memory device's health, usage, or performance (e.g. hot count or bit error rate). Temperature throttling may be implemented that considers the memory device's health, usage, or performance (e.g. hot count or bit error rate). Likewise, throttling based on the memory device's health, usage, or performance may utilize the memory device's temperature to optimize throttling time. For example, a test mode matrix (TMM) may be modified to depend on temperature.


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