The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 2018
Filed:
Apr. 20, 2015
Intel Corporation, Santa Clara, CA (US);
Robert L. Farrell, Granite Bay, CA (US);
Prasoonkumar Surti, El Dorado Hills, CA (US);
Vasanth Ranganathan, El Dorado Hills, CA (US);
Karol A. Szerszen, Rancho Cordova, CA (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
An apparatus and method are described for performing efficient depth test operations. For example, an apparatus in accordance with one embodiment comprises: a depth cache to store a plurality of cache lines containing depth data to be used for graphics processing operations; depth test logic to determine a current depth test function associated with a read operation and to read a cache line from a depth cache while there are still outstanding writes to the cache line if the read operation and write operation are associated with the same depth test function, the depth test logic to perform a first depth test using the data read from the cache line, the first depth test to fail or pass pixels based on a predicted range of depth values.