The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 2018
Filed:
Jun. 24, 2013
Carl Zeiss Microscopy Gmbh, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A method for preparing for and carrying out the microscopic recording of image stacks of a sample from various orientation angles, wherein the sample is retained in a sample retainer defining a sample coordinate system. The sample retainer can be translated and rotated in a space spanned by a detection coordinate system. In a first embodiment, for at least two different orientation angles, a projection image is recorded in the detection coordinate system and a first sample volume and a second sample volume are determined in the sample coordinate system. Then the intersection volume of the two sample volumes is determined in the sample coordinate system. Parameters necessary for image stack recording are determined for all other orientation angles based on the intersection volume.