The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 2018

Filed:

Mar. 20, 2014
Applicant:

National University Corporation Kyoto Institute of Technology, Kyoto-shi, JP;

Inventors:

Yasuhiro Awatsuji, Kyoto, JP;

Peng Xia, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/00 (2006.01); G01J 1/04 (2006.01); G01B 11/24 (2006.01); G02B 21/00 (2006.01); G01J 1/44 (2006.01); G02B 21/14 (2006.01);
U.S. Cl.
CPC ...
G01J 1/0429 (2013.01); G01B 11/24 (2013.01); G01J 1/44 (2013.01); G02B 21/0016 (2013.01); G02B 21/14 (2013.01);
Abstract

A complex amplitude information measurement apparatus () according to the present invention includes pixel sensor groups for generating a difference from one pixel sensor group to another in the optical distance of object light traveling from a measurement object (); a camera () provided with an image sensor for recording, with a single-shot exposure, the object light that has passed through or been reflected from the pixel sensor groups to obtain intensity information of the measurement object; and a computer () for computing, on the basis of the intensity information, phase information of the measurement object ().


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