The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 2018

Filed:

Apr. 12, 2016
Applicant:

Mitutoyo Corporation, Kawasaki-shi, Kanagawa, JP;

Inventor:

Shohei Udo, Miyazaki, JP;

Assignee:

MITUTOYO CORPORATION, Kawasaki-Shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 21/04 (2006.01); G01B 11/24 (2006.01); G01B 11/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/24 (2013.01); G01B 11/005 (2013.01); G01B 21/045 (2013.01);
Abstract

Provided is an object image measurement apparatus including an image capturing part that image-captures an object; a movement mechanism that changes an image capturing position of the image capturing part to the object; and a calculation part that calculates a correction value from a first captured image group acquired by placing the image capturing part static at each of a plurality of image capturing positions and a second captured image group acquired by relatively moving the image capturing part so as to pass each of a plurality of the image capturing positions. The first captured image group and the second captured image group are captured image groups of images captured at a plurality of the predetermined image capturing positions by the image capturing part.


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