Macronix International Co., Ltd.

Yung-Feng Lin

Chun-Hsiung Hung

Su-Chueh Lo

Kuen-Long Chang

Hsin-Yi Ho

Nian-Kai Zous

I-Jen Huang

Hang-Ting Lue

Teng-Hao Yeh

Chun-Yi Lee

Yi-Fan Chang

Yin-Jen Chen

Yun-Chen Chou

Cheng-Lin Sung

Tai-Feng Chen

Han-Sung Chen

Ho-Chun Liou

Kuo-Yu Liao

Fu-Kai Tsai

A memory device includes a high density or 3D data memory and a 3D reference memory. The reference memory is used to generate a reference signal used to sense data in the data memory. Conversion circuitry converts signals from one memory cell or a group of memory cells in the reference memory into a reference signal. The reference signal is applied to a sense amplifier to sense data stored in a selected memory cell in the data memory.

High density memory with reference memory using grouped cells and corresponding operations

A memory device supporting multi-address read operations improves throughput on a bi-directional serial port. The device includes a memory array and an input/output port having an input mode and an output mode. The input/output port has at least one signal line used alternately in both the input and output modes. A controller includes logic configured to execute a multi-address read operation in response to receiving a read command on the input/output port, the multi-address read operation including receiving a first address and a second address using the at least one signal line before outputting data.

Method and system for enhanced multi-address read operations in low pin count interfaces

A memory device and an operation method thereof are provided. The memory device comprises: a memory array; a decoding circuit coupled to the memory array, the decoding circuit including a plurality of first transistors, a plurality of second transistors and a plurality of inverters, the first transistors and the second transistors are paired; and a controller coupled to the decoding circuit, wherein the paired first transistors and the paired second transistors are respectively coupled to a corresponding one inverter among the inverters, and respectively coupled to a corresponding one among a plurality of local bit lines or a corresponding one among a plurality of local source lines; the first transistors are coupled to a global bit line; and the second transistors are coupled to a global source line.

Memory device and operation method thereof

A memory device supporting multi-address read operations improves throughput on a bi-directional serial port. The device includes a memory array and an input/output port having an input mode and an output mode. The input/output port has at least one signal line used alternately in both the input and output modes. A controller includes logic configured to execute a multi-address read operation in response to receiving a read command on the input/output port in the input mode, the multi-address read operation including receiving a first address and a second address using the at least one signal line in the input mode before switching to the output mode, switching to the output mode and outputting data identified by the first address using the at least one signal line.

Method and system for enhanced read performance in low pin count interface

A mechanism is described for accommodating variations in the read or write window which are caused by variations in the number of half-selected cells which are in each logic state and share an access line with the target cell. Roughly described, leakage current is detected on the access line in one segment of the read or write operation, and read or write current detected or generated in a second segment of the operation is adjusted to compensate for the detected leakage current. The first segment can be omitted in subsequent read or write operations if the target cell word line address has not changed and the leakage-tracked reference value has not become invalid for other reasons.

Leakage current compensation in crossbar array

A memory device and associated control methods are provided. The memory device is electrically connected to M bit lines and N word lines. The memory device includes a memory array having memory cells and a controller. The memory cells are located at intersections of the M bit lines and the N word lines. A selected memory cell including a storage element and a selector switch is electrically connected to an m-th bit line and an n-th word line. The controller changes a cell cross voltage of the selected memory cell in the first duration, the second duration, and the post duration, respectively. The cell cross voltage in the first duration is greater than the cell cross voltage in the post duration, and the cell cross voltage in the post duration is greater than the cell cross voltage in the second duration.

Phase change memory apparatus and read control method to reduce read disturb and sneak current phenomena

A memory device includes a plurality of sense amplifiers coupled with an array of memory cells, a plurality of output data lines receiving outputs of corresponding sense amplifiers, and a plurality of precharge circuits configured to apply a precharge voltage on the output data lines. A controller provides control signals to the sense amplifiers and to the precharge circuits, including to cause the precharge circuits to precharge the output data lines before the sense amplifiers drive output data signals to the output data lines. The plurality of sense amplifiers includes banks of sense amplifiers, and each bank includes a sense amplifier having an output driving each output data line. The memory device includes data output multiplexers having inputs coupled to the output data lines, and the precharge circuits are coupled to the output data lines between outputs of the sense amplifiers and the data output multiplexers.

Device and method for improving reading speed of memory

A decoding circuit includes a pre-trigger signal generating unit, a comparing unit, and a starting signal generating unit. The pre-trigger signal generating unit receives the former encoded data and generates a pre-trigger signal when the former encoded data of the received command matches the corresponding former encoded data of a predetermined command. The comparing unit generates a match signal when the latter encoded data of the received command is the same with the latter encoded data of the predetermined command. The starting signal generating unit outputs a starting signal according to the pre-trigger signal and the match signal. The starting signal starts a corresponding operation of the predetermined command.

Command decoding method and circuit of the same

An integrated circuit includes an array of memory cells with a plurality of columns and rows. A plurality of data lines is coupled to the columns in the array and a plurality of word lines is coupled to the rows in the array. Clamp transistors are coupled to respective data lines in the plurality of data lines, and adapted to prevent voltage on the respective bit lines from overshooting a target level during a precharge interval. A bias circuit is coupled to the clamp transistors on the plurality of bit lines, and arranged to apply the bias voltage in at least two phases within a precharge interval, and to prevent overshoot of the target level on the bit line.

Memory array with two-phase bit line precharge

An output buffer includes a first output transistor, a first switch, a second switch and a third switch. The first output transistor is connected to a first operational voltage for outputting the first operational voltage as the data signal. The first switch is connected to a bulk of the first output transistor for receiving an enable signal. The second switch is connected to the first switch and a second operational voltage for receiving the enable signal, wherein the second operational voltage is lower than the first operational voltage. The third switch includes a first terminal connected to the bulk of the first output transistor, a control terminal connected to the first switch, and a second terminal connected to the first operational voltage.

High voltage sustainable output buffer

A decoding circuit for decoding a command is provided. The received command is transmitted during at least two clock periods of a clock signal, and the received command is divided to a former encoded data and a latter encoded data. The decoding circuit includes a pre-trigger signal generating unit, a comparing unit, and a starting signal generating unit. The pre-trigger signal generating unit receives the former encoded data and generates a pre-trigger signal when the former encoded data of the received command matches the corresponding former encoded data of a predetermined command. The comparing unit generates a match signal when the latter encoded data of the received command is the same with the latter encoded data of the predetermined command. The starting signal generating unit outputs a starting signal according to the pre-trigger signal and the match signal. The starting signal starts a corresponding operation of the predetermined command.

TX output combining method between different bands

A memory and method for charging a word line thereof are disclosed. The memory includes a first word line driver, a first word line and a first switch. The first word line driver is connected to a first operational voltage for receiving a first control signal. The first word line comprises a start terminal connected to an output terminal of the first word line driver. The first switch is connected to a second operational voltage and an end terminal of the first word line. The second operational voltage is not smaller than the first operational voltage. When the first word line driver is controlled by the first control signal to start charging up the first word line, the first switch is simultaneously turned on to provide another charging path for the first word line until the first word line is charged to the first operational voltage.

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Taoyuan County, Taiwan

Yung-Feng Lin