Macronix International Co., Ltd.

Yung-Chun Li

Yu-Ming Chang

Han-Wen Hu

Tei-Wei Kuo

Yuan-Hao Chang

Hsiang-Pang Li

Huai-Mu Wang

Bo-Rong Lin

Ping-Hsien Lin

Yu-Ming Huang

Chih-Chang Hsieh

Wei-Chen Wang

Cheng-Yuan Wang

Chien-Chung Ho

Hsing-Chen Lu

Chih-Huai Shih

Chun-Hsiung Hung

Hang-Ting Lue

Teng-Hao Yeh

Feng-Min Lee

Po-Hao Tseng

Tzu-Hsuan Hsu

Shih-Fu Huang

Kun-Chi Chiang

A page buffer circuit adapted for a page-read device which including a memory array having several pages and several bit lines. The page buffer circuit comprises the following elements. First latches, receive a weight-vector from a corresponding one of the pages through the bit lines, and import an input-vector through a data input/output path. The weight-vector has a plurality of weight bit-data, and the input-vector has a plurality of input bit-data. Second latches, store the input bit-data of the input-vector. Logic operation units, coupled to the first latches to receive the weight bit-data, and coupled to the second latches to receive the input bit-data, perform a logic operation of the input bit-data and the weight bit-data to generate a logic operation result. The logic operation result is sent to one the first latches. A control circuit, selectively enables the logic operation units to perform the logic operation.

Page buffer circuit and operating method thereof adapted for page read device

A filtered search method, for performing a search within a data set, and the data set includes several data points. The filtered search method includes the following steps. Dividing the data set into several clusters based on a similarity of the data points. Dividing each of the clusters into an inlier part and an outlier part based on a distribution density of the data points. Performing a coarse search on all of the inlier parts, to filter out inlier parts of a first candidate number. Performing a fine search on the inlier parts of the first candidate number, to search data points of a second candidate number. Obtaining a search result based on the data points of the second candidate number, and the data points of the second candidate number are close to a target point.

Filtered search method

A memory device for CIM, applicable to a 3D AND-type flash memory, includes a memory array, input word line pairs, and a signal processing circuit. The memory array includes first and second pairs of memory cells. Each first pair of memory cells includes a first memory cell set coupled to a first GBL and a second memory cell set coupled to a second GBL. Each second pair of memory cells includes a third memory cell set coupled to the first GBL and a fourth memory cell set coupled to the second GBL. Each input word line pair includes a first input word line coupled to the first and the second memory cell sets, and a second input word line coupled to the third and the fourth memory cell sets s. The signal processing circuit is coupled to the first and second global bit lines.

Memory device for computing in-memory

An in-memory computing method and an in-memory computing apparatus are adapted to perform multiply-accumulate (MAC) operations on a memory by a processor. In the method, a pre-processing operation is respectively performed on input data and weight data to be written into input lines and memory cells of the memory to divide the input data and weight data into a primary portion and a secondary portion. The input data and the weight data divided into the primary portion and the secondary portion are written into the input lines and the memory cells in batches to perform the MAC operations and obtain a plurality of computation results. According to a numeric value of each of the computation results, the computation results are filtered. According to the portions to which the computation results correspond, a post-processing operation is performed on the filtered computation results to obtain output data.

In-memory computing method and in-memory computing apparatus

A non-volatile memory and a programming method thereof are provided. The programming method of the non-volatile memory includes the following steps. A coarse programming procedure is performed for programing all of a plurality of memory cells at an erase state to 2{circumflex over ( )}N−1 or 2{circumflex over ( )}N program states. N is a positive integer. A fine programming procedure is performed for pushing all of memory cells into 2{circumflex over ( )}N−1 or 2{circumflex over ( )}N verify levels.

Non-volatile memory and programming method thereof

A memory device, includes a memory array for storing a plurality of vector data each of which has an MSB vector and a LSB vector. The memory array includes a plurality of memory units each of which has a first bit and a second bit. The first bit is used to store the MSB vector of each vector data, the second bit is used to store the LSB vector of each vector data. A bit line corresponding to each vector data executes one time of bit-line-setup, and reads the MSB vector and the LSB vector of each vector data according to the bit line. The threshold voltage distribution of each memory unit is divided into N states, where N is a positive integer and N is less than 2 to the power of 2, and the effective bit number stored by each memory unit is less than 2.

Memory device and operating method thereof

A memory chip, a memory device and an operation method are disclosed. The memory chip includes a number of memory units and a control logic circuit. The memory units could be configured as TLC, MLC or SLC. The control logic circuit is configured to use TLC programming approach to program MLC and SLC.

Memory chip, memory device and operation method thereof

A storage device and a data accessing method are disclosed, wherein the storage device includes a memory circuit and a control circuit. The memory circuit includes a plurality of multi-level cells, and each of the multi-level cells is configured to store at least a first bit, a second bit and a third bit in at least a first page, a second page and a third page. The control circuit is configured to read the first bits according to a one-time reading operation related to the first bits, read the second bits according to M-times reading operations related to the second bits, and read the third bits according to N-times reading operations related to the third bits, wherein the difference between M and N is less than or equal to one.

Storage device and data accessing method using multi-level cell

Systems, methods, and apparatus including computer-readable mediums for determining read voltages for memory systems are provided. In one aspect, a memory system includes a memory storing data and a memory controller coupled to the memory. The memory controller is configured to: obtain a first reading output of target memory data in the memory using a first read voltage, and in response to determining that the first reading output fails to pass an Error-Correcting Code (ECC) test, provide the first read voltage to the memory. The memory is configured to: determine a second read voltage based on the first read voltage and generate a second reading output of the target memory data using the second read voltage.

Determining read voltages for memory systems

A memory device and an operation method thereof are provided. The operation method includes: in a first phase, selecting a global signal line, selecting a first string select line, unselecting a second string select line, selecting a first word line, and unselecting a second word line; sensing during a second phase; in a third phase, keeping voltages of the global signal line, the selected first word line and the unselected second word line, unselecting the first string select line and selecting the second string select line to switch voltages of the first and the second string select lines; and sensing during a fourth phase.

Memory device and operation method thereof

A memory device and an operation method thereof are provided. The memory device includes: a plurality of page buffers, storing an input data; a plurality of memory planes coupled to the page buffers, based on received addresses of the memory planes, a plurality of weights stored in the memory planes, the memory planes performing bit multiplication on the weights and the input data in the page buffers in parallel to generate a plurality of bit multiplication results in parallel, the bit multiplication results stored back to the page buffers; and at least one accumulation circuit coupled to the page buffers, for performing bit accumulation on the bit multiplication results of the memory planes in parallel or in sequential to generate a multiply-accumulate (MAC) operation result.

Systems, methods, and apparatus including computer-readable mediums for determining read voltages for memory systems with machine learning (ML) are provided. In one aspect, a memory system includes a memory and a memory controller configured to: obtain a first reading output of memory data using a first read voltage corresponding to a first set of parameters associated with the memory data; if the first reading output fails to pass an Error Correction Code (ECC) test, obtain a second reading output of the memory data using a second read voltage corresponding to a second set of parameters associated with the memory data and including the first set of parameters, the second read voltage being generated using at least one ML algorithm based on the second set of parameters; and if the second reading output passes the ECC test, output the second reading output as a target reading output of the memory data.

Determining read voltages for memory systems with machine learning

A data management method for a memory is provided. The memory includes memory pages. Each of the memory pages includes memory cells. A data update command corresponding to a logical address is received. The logical address maps to a physical address of a target memory page before receiving the data update command. First and second reading voltages are applied to obtain at least a first and a second target memory cell to be sanitized in the target memory page of the memory pages, a first programming voltage is applied to change the logical state of the first target memory cell to a logical state with a higher threshold voltage, and a second programming voltage is applied to change the logical state of the second target memory cell to a logical state with a higher threshold voltage. The first programming voltage is different from the second programming voltage.

Data management method for memory and memory apparatus using the same

A memory data management method includes the following steps reading a plurality of data of a plurality of memory cells of a memory block; determining whether error bits of the data exceed an error correction code (ECC) threshold; if the error bits of the data exceed the ECC threshold, a programming process being executed to increase a first threshold voltage of a first state data of the data for exceeding a first threshold, to increase a second threshold voltage of a second state data of the data for exceeding a second threshold, and to increase a third threshold voltage of a third state data of the data for exceeding a third threshold.

Memory data management method

Provided is a programming method for a memory device including a memory array and a controller. The programming method including: controlling programming on a first page of a first word line by the controller; controlling programming on a first page of a second word line by the controller, the second word line being adjacent to the first word line; controlling for performing a first programming operation on a second page of the first word line by the controller; controlling programming on a first page of a third word line by the controller, the third word line being adjacent to the second word line; controlling for performing the first programming operation on a second page of the second word line by the controller; and controlling for performing a second programming operation on the second page of the first word line by the controller.

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Taipei, Taiwan

Yung-Chun Li