Xintec Corporation

Other

Taiwan Semiconductor Manufacturing Comp. Ltd.

Industrial Technology Research Institute

Ying-Nan Wen

Chien-Hung Liu

Ho-Yin Yiu

Shu-Ming Chang

Shih-Yi Lee

Wei-Chung Yang

Yen-Shih Ho

Baw-Ching Perng

Tsang-Yu Liu

Wei-Ming Chen

Chia-Lun Tsai

Bai-Yao Lou

Szu-Wei Lu

Chia-Ming Cheng

Ching-Yu Ni

Wen-Cheng Chien

Chien-Hui Chen

Po-Han Lee

Yu-Lung Huang

Yi-Ming Chang

Ruoh-Huey Uang

Chi-Chang Liao

Hung-Jen Lee

Ling-Chen Kung

Tsung-Yao Chu

Yun-Ji Hsieh

Yun-Jui Hsieh

A chip package including a first substrate is provided. The first substrate includes a sensing device. A second substrate is attached onto the first substrate and includes an integrated circuit device. A first conductive structure is electrically connected to the sensing device and the integrated circuit device through a redistribution layer disposed on the first substrate. An insulating layer covers the first substrate, the second substrate and the redistribution layer. The insulating layer has a hole therein and a second conductive structure is disposed under the bottom of the hole. A method for forming the chip package is also provided.

Chip package and method for forming the same

A method for forming a sensing device includes providing a first substrate. The first substrate has a first surface and a second surface opposite thereto. A sensing region is adjacent to the first surface. A temporary cover plate is provided on the second surface to cover the sensing region. The method also includes forming a redistribution layer on the second surface and electrically connected to the sensing region. The method further includes removing the temporary cover plate after the formation of the redistribution layer. The first substrate is bonded to a second substrate and a cover plate after the removal of the temporary cover plate so that the first substrate is positioned between the second substrate and the cover plate. In addition, the method includes filling an encapsulating layer between the second substrate and the cover plate to surround the first substrate.

Wafer-level packaging sensing device and method for forming the same

A chip package is provided. The chip package includes a sensing device. The chip package also includes a first conductive structure disposed on the sensing device and electrically connected to the sensing device. The chip package further includes a chip and a second conductive structure disposed on the sensing device. The chip includes an integrated circuit device. The second conductive structure is positioned on the chip and is electrically connected to the integrated circuit device and the first conductive structure. In addition, the chip package includes an insulating layer covering the sensing device and the chip. The insulating layer has a hole. The first conductive structure is positioned under the bottom of the hole. The top surface of the insulating layer is coplanar with the top surface of the second conductive structure. A method for forming the chip package is also provided.

Chip package having chip connected to sensing device with redistribution layer in insulator layer

A chip package is provided. The chip package includes a substrate having conductive pads therein and adjacent to a first surface thereof. Chips are attached on a second surface opposite to the first surface of the substrate, and an encapsulation layer covers the chips. First redistribution layers are disposed between the second surface of the substrate and the encapsulation layer, and second redistribution layers are disposed on the encapsulation layer. First conductive structures and second conductive structures are disposed in the encapsulation layer. Each of first and second conductive structures respectively includes at least one bonding ball. The first conductive structures are configured to connect first and second redistribution layers, and the second conductive structures are configured to connect the second redistribution layers and the chip. A method of forming the chip package is also provided.

Chip package

Method for forming chip package having chip connected to sensing device with redistribution layer in insulator layer

A chip package includes a chip, a laser stop layer, a first through hole, an isolation layer, a second through hole and a conductive layer. The laser stop layer is disposed above a first surface of the chip, and the first through hole is extended from a second surface to the first surface of the chip to expose the laser stop layer. The isolation layer is below the second surface and in the first through hole, and the isolation layer has a third surface opposite to the second surface. The second through hole is extended from the third surface to the first surface, and the second through hole is through the first through hole to expose the laser stop layer. The conductive layer is disposed below the third surface and extended into the second through hole to contact the laser stop layer.

Chip package and fabrication method thereof

A chip module is provided. The chip module includes a chip having an upper surface, a lower surface and a sidewall. The chip includes a signal pad region adjacent to the upper surface. A recess extends from the upper surface toward the lower surface along the sidewall of the chip. A redistribution layer is electrically connected to the signal pad region and extends into the recess. A circuit board is located between the upper surface and the lower surface and extends into the recess. A conducting structure is located in the recess and electrically connects the circuit board to the redistribution layer. A method for forming the chip module is also provided.

Chip module and method for forming the same

A chip package included a chip, a first though hole, a laser stop structure, a first isolation layer, a second though hole and a conductive layer. The first though hole is extended from the second surface to the first surface of the chip to expose a conductive pad, and the laser stop structure is disposed on the conductive pad exposed by the first through hole, which an upper surface of the laser stop structure is above the second surface. The first isolation layer covers the second surface and the laser stop structure, and the first isolation layer has a third surface opposite to the second surface. The second though hole is extended from the third surface to the second surface to expose the laser stop structure, and a conductive layer is on the third surface and extended into the second though hole to contact the laser stop structure.

Method of fabricating chip package with laser

A chip package includes a chip, a laser stopper, an isolation layer, a redistribution layer, an insulating layer, and a conductive structure. The chip has a conductive pad, a first surface, and a second surface opposite to the first surface. The conductive pad is located on the first surface. The second surface has a first though hole to expose the conductive pad. The laser stopper is located on the conductive pad. The isolation layer is located on the second surface and in the first though hole. The isolation layer has a third surface opposite to the second surface. The isolation layer and the conductive pad have a second though hole together, such that the laser stopper is exposed through the second though hole. The redistribution layer is located on the third surface, the sidewall of the second though hole, and the laser stopper.

Chip package and manufacturing method thereof

A chip package includes a chip, a laser stopper, an isolation layer, a redistribution layer, an insulating layer, and a conductive structure. The chip has a conductive pad, a first surface, and a second surface. The conductive pad is located on the first surface. The second surface has a first through hole to expose the conductive pad. The laser stopper is located on the conductive pad in the first through hole. The isolation layer is located on the second surface and in the first through hole. The isolation layer has a third surface opposite to the second surface, and has a second through hole to expose the laser stopper. The redistribution layer is located on the third surface, a sidewall of the second through hole, and the laser stopper in the second through hole. The conductive structure is located on the redistribution.

Chip package having a laser stop structure

Chip package having a dual through hole redistribution layer structure

A semiconductor package includes a semiconductor chip, a first and a second depression, a first and second redistribution layer and a packaging layer. The semiconductor chip has an electronic component and a conductive pad that are electrically connected and disposed on an upper surface of the semiconductor chip. The first depression and first redistribution layer extend from the upper surface toward the lower surface of the semiconductor chip. The first redistribution layer and the conductive pad are electrically connected. The second depression and the second redistribution layer extends from the lower surface toward the upper surface and is in connection with the first depression through a connection portion. The second redistribution layer is electrically connected to the first redistribution layer through the connection portion. The packaging layer is disposed on the lower surface.

Chip package having extended depression for electrical connection and method of manufacturing the same

A chip package including a first substrate is provided. A plurality of first conductive pads is disposed on a first side of the first substrate. A second substrate is attached onto a second side opposite to the first side of the first substrate. The second substrate includes a micro-electric element and has a plurality of second conductive pads corresponding to the plurality of first conductive pads, disposed on a first side of the second substrate and between the first substrate and the second substrate. A redistribution layer is disposed on a second side opposite to the first side of the second substrate. The redistribution layer penetrates the second substrate, second conductive pads and the first substrate and extends into the first conductive pads to electrically connect the first and second conductive pads.

A chip scale package structure includes a chip, a dam unit, a board body, a plurality of first conductors, an encapsulating glue, a plurality of first conductive layers, an isolation layer, and a plurality of first electrodes. The dam unit is disposed on the surface of the chip. The board body is located on the dam unit. The first conductors are respectively in electrical contact with the conductive pads of the chip. The encapsulating glue covers the surface of the chip, and the board body and the first conductors are packaged in the encapsulating glue. The first conductive layers are located on the surface of the encapsulating glue opposite to the chip and respectively in electrical contact with the first conductors. The isolation layer is located on the encapsulating glue and the first conductive layers. The first electrodes are respectively in electrical contact with the first conductive layers.

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Hsinchu, Taiwan

Ying-Nan Wen