Taiwan Semiconductor Manufacturing Comp. Ltd.

Vanguard International Semiconductor Corporation

Yin-Pin Wang

Chun Hsiung Tsai

Shahaji B More

Cheng-Yi Peng

Kuo-Feng Yu

Da-Wen Lin

Jian-Hao Chen

Chih-Sheng Chang

Ka-Hing Fung

Shui-Ming Cheng

Chin-Sheng Chang

Kuan-Lun Cheng

Carlos H Diaz

Chung-Ju Lee

Fu-Liang Yang

Chang-Miao Liu

Xusheng Wu

Bwo-Ning Chen

Huan-Tsung Huang

Wen-Jya Liang

Yuh-Sheng Chern

Hsin Yi Lee

Jhy-Weei Hsia

Yuh-Sheng Jean

A method includes performing a first etching process on a backside of a substrate to expose a dummy contact structure, performing a first deposition process to deposit a first portion of an oxide layer around the dummy contact structure, performing a second etching process to at least partially remove the first portion of oxide layer, forming a spacer layer around the dummy contact structure, performing a second deposition process to form a second portion of the oxide layer around the spacer layer, removing the spacer layer and the dummy contract structure to leave an opening, and filling the opening with a conductive material to form a conductive plug.

Enlarged backside contact

A method and structure for doping source and drain (S/D) regions of a PMOS and/or NMOS FinFET device are provided. In some embodiments, a method includes providing a substrate including a fin extending therefrom. In some examples, the fin includes a channel region, source/drain regions disposed adjacent to and on either side of the channel region, a gate structure disposed over the channel region, and a main spacer disposed on sidewalls of the gate structure. In some embodiments, contact openings are formed to provide access to the source/drain regions, where the forming the contact openings may etch a portion of the main spacer. After forming the contact openings, a spacer deposition and etch process may be performed. In some cases, after performing the spacer deposition and etch process, a silicide layer is formed over, and in contact with, the source/drain regions.

FinFET fabrication methods

A semiconductor includes a semiconductor substrate, a gate stack on the semiconductor substrate, and a stressor having at least a portion in the semiconductor substrate and adjacent to the gate stack. The stressor includes a first stressor region and a second stressor region on the first stressor region, wherein the second stressor region extends laterally closer to a channel region underlying the gate stack than the first stressor region.

Dual-SiGe epitaxy for MOS devices

An SOI device () has a gate electrode with one or more additional gate regions (), and oxygen or halogen ions () under the additional gate regions (). The oxygen or halogen ions () form thicker gate oxide regions or shallow trench isolation regions.

Body contact formation in partially depleted silicon on insulator device

A semiconductor structure including SRAM cells with improved write margins and a method for forming the same are provided. The semiconductor structure comprises a substrate including a core circuit and an SRAM cell. The SRAM cell includes a pull-up PMOS device that comprises a first source/drain region in the substrate, a first SiGe stressor having a portion overlapping at least a portion of the first source/drain region, and a first current-tuning region having a portion overlapping at least a portion of the first source/drain region. The core circuit comprises a core PMOS device that comprises a second source/drain region in the substrate, and a second SiGe stressor having a portion overlapping at least a portion of the second source/drain region. The core PMOS device is free of current-tuning regions.

Write margin improvement for SRAM cells with SiGe stressors

A semiconductor device () has a source () a gate () and a drain (), a single deep-pocket ion implant () in a source-drain depletion region, and a single shallow-pocket ion implant () in the source-drain depletion region.

Semiconductor device with asymmetric pocket implants

A method of fabricating a MOSFET device featuring a raised source/drain structure on a heavily doped source/drain region as well as on a portion of a lightly doped source/drain (LDD), region, after removal of an insulator spacer component, has been developed. After formation of an LDD region a composite insulator spacer, comprised of an underlying silicon oxide spacer component and an overlying silicon nitride spacer component, is formed on the sides of a gate structure. Formation of a heavily doped source/drain is followed by removal of the silicon nitride spacer resulting in recessing of, and damage formation to, the heavily doped source/drain region, as well as recessing of the gate structure. Removal of a horizontal component of the silicon oxide spacer component results in additional recessing of the heavily doped source/drain region, and of the gate structure. A selective epitaxial growth procedure is then used to form a raised, single crystalline silicon structure on the recessed and damaged heavily doped source/drain and LDD regions, while a polycrystalline silicon structure is grown on the underlying recessed gate structure. Metal silicide is then formed on the raised, single crystalline silicon structure and on the polycrystalline silicon structure.

Method of fabricating a high performance MOSFET device featuring formation of an elevated source/drain region

The present invention provides methods for manufacturing semiconductor devices. In one embodiment, the method includes forming a gate oxide over a substrate and a gate electrode over the gate oxide. The method also includes implanting impurities into the substrate using the gate electrode as an implant mask to form lightly-doped regions in the substrate. The method further includes forming a first spacer adjacent the gate electrode, and implanting impurities into the substrate and through a portion of the lightly-doped regions using the first spacer as an implant mask to form deep source/drain regions in the substrate. The method still further includes forming a second spacer adjacent the first spacer, implanting impurities into the substrate using the second spacer as an implant mask to form a graded source/drain region in the substrate, and removing the second spacer. Also disclosed is a semiconductor device constructed using the techniques disclosed herein.

Method for manufacturing a semiconductor device having an improved disposable spacer

Within a method for fabricating a semiconductor substrate while employing formed thereover a mask layer there is first employed the mask layer as an etch mask layer for forming a pair of isolation trenches within the semiconductor substrate and then laterally etched the mask layer prior to employing the laterally etched mask layer as an oxidation mask layer. By laterally etching the mask layer, there is formed within the semiconductor substrate a continuously curved convex elevated region as an active region of the semiconductor substrate.

Method for forming semiconductor substrate with convex shaped active region

A method for manufacturing a shallow trench isolation structure. A pad oxide layer and a mask layer are formed over a substrate. Portions of the mask layer, the pad layer and substrate are removed forming a trench. Oxidation of the substrate within the trench forms a linear oxide layer. The substrate at the bottom of the trench is exposed by removing a portion of the linear oxide layer at the bottom of the trench. A polysilicon layer, deposited completely over the mask, fills the trench as well. The polysilicon layer on the mask layer and outside the trench is removed, leaving polysilicon within the trench, which forms a polysilicon plug. A thin conformal barrier layer is formed over the substrate. An insulator layer is deposited above the barrier layer. The isolation layer and barrier layer on top of the mask as well as outside the trench are removed using a chemical mechanical polishing method. The mask is removed.

Growing community of inventors

Kaohsiung, Taiwan

Yin-Pin Wang