Intel Corporation

Sk Hynix Nand Product Solutions Corp.

Yi Xu

Florence R Pon

Yuhong Cai

Tyler Leuten

Mark Forsnes

Hyoung Il Kim

Bilal Khalaf

William Glennan

Eleanor Patricia Paras Rabadam

James Zhang

Embodiments of the present disclosure may generally relate to systems, apparatus, and/or processes directed to an interposer with step features used to electrically couple stacked dies. In embodiments, the step features may appear as a ziggurat shape to one or more sides of the interposer, which may be referred to as a ziggurat interposer. The interposer may have electrical routing disposed within to electrically couple the first face of the one of the step features with a die.

Interposer with step feature

Embodiments disclosed herein include electronic packages with chocked flow cooling. In an embodiment, an electronic package may comprise a package substrate, a die electrically and mechanically coupled to the package substrate, and a lid over the die. In an embodiment, the lid has a first opening and a second opening that is opposite from the first opening. In an embodiment, the electronic package may further comprise a coolant plate covering the first opening. In an embodiment, the coolant plate comprises a first surface facing away from the die and a second surface facing the die, and a plurality of vents from the first surface to the second surface. In an embodiment, the first openings of the plurality of vents have a first dimension and second openings of the plurality of vents have a second dimension that is smaller than the first dimension.

Choked flow cooling

Integrated circuit assemblies may contain various mold, fill, and/or underfill materials. As these integrated circuit assemblies become ever smaller, it becomes challenging to prevent voids from forming within these materials, which may affect the reliability of the integrated circuit assemblies. Since integrated circuit assemblies are generally formed by electrically attaching integrated circuit dice on electronic substrates, the present description proposes injecting the mold, fill, and/or underfill materials through openings formed in the electronic substrate to fill voids that may form and/or to prevent the formation of the voids altogether.

Through-substrate void filling for an integrated circuit assembly

Embodiments described herein provide a semiconductor package comprising multiple dies encapsulated in multiple molding compounds. In one example, a semiconductor package comprises: a first die or die stack on a substrate; a first molding compound encapsulating the first die or die stack on the substrate; a second die or die stack on the first molding compound; and a second molding compound encapsulating the second die or die stack and at least one portion of the first molding compound. In this example, the first die or die stack is electrically coupled to the substrate using a first wire bond and the second die or die stack is electrically coupled to the substrate using a second wire bond. Additionally, the first molding compound encapsulates the first wire bond and the second molding compound encapsulates the second wire bond. Furthermore, a footprint of the second die overlaps a footprint of the first die.

Die over mold stacked semiconductor package

Embodiments disclosed herein include wire bonds and tools for forming wire bonds. In an embodiment, a wire bond may comprise a first attachment ball, and a first wire having a first portion contacting the first attachment ball and a second portion. In an embodiment, the wire bond may further comprise a second attachment ball, and a second wire having a first portion contacting the second attachment ball and a second portion. In an embodiment, the second portion of the first wire is connected to the second portion of the second wire.

Growing community of inventors

Folsom, CA, United States of America

Yi Xu