Fujitsu Corporation

Yasuo Kamiya

Satoru Yoshikawa

A floor plan and a cell layout in each of a plurality of blocks are designed. A clock tree is generated in such a manner that the clock skew in each lower level block is minimum. Placement position of a root clock driver and information about an area where the cells can be placed are given to the upper level block. An average delay value of delay values from the root clock driver to a distal buffer is obtained for each block. A flock tree is generated based on these information in such a manner that the clock skew between the higher level block is minimum. If a buffer is newly generated, then its placement position is adjusted based on the cell layout of the lower level block. Wire is distributed in the lower and then in the higher level blocks.

LAYOUT DESIGN SYSTEM OF SEMICONDUCTOR IC DEVICE, LAYOUT DESIGN METHOD OF SEMICONDUCTOR IC DEVICE AND COMPUTER-READABLE RECORDING MEDIUM ON WHICH PROGRAMS FOR ALLOWING COMPUTER TO EXECUTE RESPECTIVE MEANS IN THE SYSTEM OR RESPECTIVE STEPS IN THE METHOD ARE RECORDED

A method conducts logic simulation in an integrated circuit device, in which a macro containing logic circuits formed therein is included in a chip including a plurality of cells. The method determines a first delay parameter relating to an input terminal of an internal cell of the macro connected to the input terminal of the macro, and a second delay parameter relating to an output terminal of an internal cell of the macro connected to the output terminal of the macro. The method then determines delay time data for a whole logic circuit including the plurality of cells and the macro, in accordance with delay parameters determined for the macro, in which the first delay parameter is taken as an input terminal delay parameter and the second delay parameter is taken as an output terminal delay parameter; delay parameters determined for the plurality of cells; and connection data for the whole logic circuit. The method merges the determined delay time data for the whole logic circuit and internal delay time data for the macro so as to conduct a logic simulation for the whole logic circuit in accordance with the merged delay time data.

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Kanagawa, Japan

Yasuo Kamiya