Micron Technology Incorporated

Yasuko Hattori

Mahdi Jamali

Daniele Vimercati

Xinwei Guo

William A Melton

Richard Edward Fackenthal

Duane R Mills

A memory device may include a digit line, a ferroelectric memory cell coupled with the digit line, a first capacitor including a first node and a second node, the first node coupled with the digit line using a first path and the second node coupled with the digit line using a second path different from the first path, and a switching component positioned in the second path and coupled with the second node of the first capacitor and the digit line, the switching component configured to selectively couple the second node of the first capacitor with the digit line. In some cases, the memory device may further include a second capacitor coupled with the digit line and the second node of the first capacitor.

Techniques and devices for canceling memory cell variations

Methods, systems, and devices for memory cell sensing stress mitigation are described. A memory device may be configured to bias a memory cell to a voltage with a first polarity or a second polarity (e.g., a positive voltage or a negative voltage) during an access operation to level wear experienced by the memory cell during the access operation. For example, during a first read operation, a first pulse with the first polarity (e.g., a negative voltage) may be applied to the memory cell to read out a first logic state stored at the memory cell. During a second read operation, a second pulse with the second polarity (e.g., a positive voltage) may be applied to the memory cell to read out a second logic state stored at the memory cell. The memory device may include a selection component for selecting between the different pulses used for different read operations.

Memory cell sensing stress mitigation

Methods, systems, and devices for self-referencing sensing schemes with coupling capacitance are described. A sense component of a memory device may include a capacitive coupling between two nodes of the sense component. The capacitive coupling may, in some examples, be provided by a capacitive element of the sense component or an intrinsic capacitance between features of the sense component. An example of a method employing such a sense component for detecting a logic state stored by a memory cell may include generating a first sense signal at one of the nodes while the node is coupled with the memory cell, and generating a second sense signal at the other of the nodes while the other node is coupled with the memory cell. The sense signals may be based at least in part on the capacitive coupling between the two nodes.

Self-referencing sensing schemes with coupling capacitance

A memory device may include a digit line, a ferroelectric memory cell coupled with the digit line, a first capacitor including a first node and a second node, the first node coupled with the digit line using a first path and the second node coupled with the digit line using a second path different from the first path, and a switching component positioned in the second path and coupled with the second node of the first capacitor and the digit line. The switching component may selectively couple the second node of the first capacitor with the digit line. In some cases, the memory device may also include a second capacitor coupled with the digit line and the second node of the first capacitor.

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Folsom, CA, United States of America

Yasuko Hattori