Huawei Technologies Co., Limited

Xiaoyun Wei

Chaojun Deng

Yong Yang

Xing Fu

Jiye Xu

A chip package structure includes a glass substrate, a routing layer, and a plurality of dies. A first surface of the glass substrate has solder joints and a second surface of the glass substrate has substrate solder balls. The routing layer is located in the glass substrate, and the solder joints are electrically connected to the substrate solder balls by using the routing layer. Each die has chip solder balls, is located on the first surface of the glass substrate, and the solder joints are bonded to the chip solder balls. The embodiments can improve connection reliability between the die and the glass substrate and can reduce a signal transmission loss.

Chip package structure, preparation method, and electronic device

Embodiments of this application provide a chip and a manufacturing method thereof, and an electronic device, and belong to the field of chip heat dissipation technologies. The chip includes a die and a thermal conductive sheet. An active surface of the die is connected to the thermal conductive sheet by using a first bonding layer. Heat generated at a part with a relatively high temperature on the active surface of the die can be quickly conducted and dispersed by using the thermal conductive sheet, so that temperatures on the active surface are evenly distributed to avoid an excessively high local temperature of the chip, thereby preventing running of the chip from being affected.

Chip and manufacturing method thereof, and electronic device

Embodiments of the application provide a vertical interconnection structure and a manufacturing method thereof, a packaged chip, and a chip packaging method. Conductive pillars are formed on a first surface of a substrate. A first insulated support layer wrapping the conductive pillars is formed on the first surface of the substrate. The conductive pillars are located in the first insulated support layer. An upper surface of the conductive pillar that is away from the substrate is not covered by the first insulated support layer. Then the substrate is removed.

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Dongguan, China

Xiaoyun Wei