Sandisk Technologies Inc.

Shanghai Foreal Optoelectronic Co., Ltd

Keiper Seating Mechanisms Co., Ltd.

Xiaohu Liu

Liang Li

Dong Liu

Cuili Fu

Fei Xiong

Weiwei Li

Wenkai Liu

Anmin Zheng

Changming Gu

Haila Hu

Yao Zheng

Chengxue Huo

Rongzhuang Mao

In a word line leakage detection process in a NAND or other non-volatile memory device, to determine leaky blocks of a memory device, a reference value for block is determined by comparing the current drawn by the peripheral circuitry of the block with a sequence of comparison current values, corresponding to a range of digital values, while the peripheral circuit is not connected to the block. The current drawn when the peripheral circuitry is connected to the block is then determined, again by comparison with a sequence of comparison values, but of a reduced range of digital values, running from an offset above the reference value to an offset below the reference value. To further reduce test times, the same reference value is used for a group of blocks, such as groups of blocks that share a set of supply lines.

Self-learning built-in self-test (BIST) for leak detection in non-volatile memory

Technology for determining a test flow for testing memory during a production phase. The following are accessed: a list of test items with a number of candidate test item conditions for each test item, defects (e.g., bad blocks) detected by each test item condition, a list of benchmark defects (e.g., bad blocks), and judgement criteria. The defects (e.g., bad blocks) for the candidate test item conditions may be compared with the benchmark defects (e.g., bad blocks) in view of judgement criteria. Based on the comparison, at least one test item may be eliminated resulting in a set of remaining test items. A production phase test flow having a test item condition for each remaining test item may be generated.

Memory testing flow set up with computational intelligence

System and method for LED light source. According to an embodiment, the present invention provides a an LED light system for emitting substantially white light. The system includes a first dichroic element, the first dichroic element comprises a first dichroic surface having a first coating, the first coating being adapted to reflect over 95% of a first color and transmit over 95% of a second color, the first dichroic surface having a first side and a second side. The system also includes a second dichroic element, the second dichroic element comprises a second dichroic surface having a second coating, the second coating being adapted to reflect over 95% of a third color and transmit 95% of a fourth color, the second dichroic surface having a third side and a fourth side.

System and method for LED light source

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Shanghai, China

Xiaohu Liu