Yangtze Memory Technologies Co., Ltd.

XiangNan Zhao

Yali Song

Lei Jin

Jianquan Jia

Hongtao Liu

Ying Cui

Kaikai You

Yuanyuan Min

Shan Li

An Zhang

Kaiwei Li

Xinlei Jia

Xueqing Huang

Meng Lou

Jinlong Zhang

Yuan-Yuan Min

Haibo Li

Changhyun Lee

Chenhui Li

Xuezhun Xie

Ying Huang

Hua Tan

Feng Xu

Da Li

Lei Guan

Shiyu Xia

Zhe Luo

Ting Cheng

Yaoyao Tian

The present application discloses a memory programming method, a memory device, and a memory system. The method comprises: performing a plurality periods of first increment step pulse programming (ISPP) on first memory cells to be programmed to a first programmed state, comprising: at a first stage of a first period of the first ISPP, performing programming suppression to the first memory cells; and at a second stage of the first period of the first ISPP, performing pulse programming to the first memory cells. As such, the programming speed of the memory cells corresponding to the first programmed state can be reduced, and a probability of the overprogramming of the memory cells corresponding to the first programmed state can also be reduced.

Memory programming method, memory device, and memory system

The present application discloses a memory, a memory system, and a method for operating memory, which belongs to the memory techniques field. The method for operating memory comprises determining a storage state of a reference memory cell, determining a discharge duration of a sensing node corresponding to a target memory cell based on the storage state of the reference memory cell, and reading the target memory cell based on the discharge duration of the sensing node corresponding to the target memory cell to obtain read results. The target memory cell and the reference memory cell are located in the same string and are adjacent, and the programming order of the reference memory cell is after that of the target memory cell. The present application may reduce the influence on reading memory cells by interlayer interference and improve the accuracy of reading memory cells.

Memory, a memory system, and a method for operating memory

A memory device, a memory system, and a program operation method are disclosed. In one example, at an iprogramming loop, in response to determining that index i is greater than or equal to a first preset value and less than an initial verification loop number corresponding to a target state of memory cells in the memory device, an iprogramming inhibition operation may be performed on the memory cells of the target state. Index i may be a positive integer, and the initial verification loop number may indicate a programming loop number that starts a verification operation corresponding to the target state of the memory cells.

Memory device, memory system, and program operation method thereof

Upon determining that a first read operation on one memory cell of a plurality of memory cells has failed, a second read operation on the memory cell is started. In the second read operation, a second pass voltage is applied to first unselected word lines, and a first pass voltage is applied to second unselected word lines. The first unselected word lines include one or more word lines adjacent to a selected word line, and the second unselected word lines include remaining unselected word lines. The selected word line corresponds to the memory cell to be read. The first pass voltage includes a voltage applied to the first unselected word lines in the first read operation. The second pass voltage is higher than the first pass voltage.

Memory device, memory system, and read operation method thereof

The present disclosure provides a method for performing a programming operation on a memory cell connected to a bit line and controlled by a word line. The method includes applying a first programming voltage signal to the word line to program the memory cell into a first state, applying a first voltage to the bit line, performing a verify operation when the memory cell is in a second state, determining a classification of the memory cell based on the verify operation, applying a second voltage to the bit line based on the determined classification, applying a second programming voltage signal to the word line to program the memory cell into the first state, applying a third voltage to the bit line, applying a third programming voltage signal to the word line to program the memory cell into the first state, and applying a fourth voltage to the bit line.

Method of improving programming operations in 3D NAND systems

Disclosure includes systems, methods and devices to program a memory device, involving a first and a second programming operations on a memory cell of the memory device. In the first programming operation, the memory cell is programmed into an intermediate state. In the second programming operation, the memory cell is programmed from the intermediate state into a target state. The first programming operation includes providing a bias voltage to a bit line coupled to the memory cell and providing a programming voltage to a word line coupled to the memory cell. An amplitude of the bias voltage provided to the bit line depends on the intermediate state or the target state the memory cell to be programmed into. Accordingly, no verification operation need to be performed on the memory cell in the first programming operation.

Memory device, memory system, and program method thereof

A three-dimensional (3D) memory device includes a first set of word lines coupled to first memory cells, a second set of word lines coupled to second memory cells, an interface dummy word line between the first and send sets of word lines, and a peripheral circuit coupled to the first and send memory cells. The peripheral circuit is configured to apply a first voltage to the interface dummy word line in a first pre-charge period when programming a first selected memory cell in the first memory cells, and apply a second voltage lower than the first voltage to the interface dummy word line in a second pre-charge period when programming a second selected memory cell in the second memory cells. Programing the first selected memory cell is earlier than the second selected memory cell.

Three-dimensional memory device programming with reduced disturbance

A three-dimensional (3D) memory device and method for reading the same are provided. The device includes memory cell strings each including multiple memory cells. In each memory cell string, a topmost memory cell is connected to a top selection gate connected to a bit line, and a bottommost memory cell is connected to a bottom selection gate. The method includes sequentially programming multiple memory cells in a memory cell string according to a programming sequence; in reading a memory cell, applying a corresponding bit line voltage to the memory cell string according to the programming sequence of the memory cell.

Three-dimensional memory device and method for reading the same

A memory device includes a memory array including memory strings, each memory string comprising a plurality of first memory cells, a plurality of second memory cells, and one or more dummy memory cells between the first memory cells and the second memory cells. The first memory cells are between drain terminals of the memory strings and the dummy memory cells, and the second memory cells are between source terminals of the memory strings and the dummy memory cells. The bit lines are respectively coupled to drain terminals of the memory strings. The word lines are respectively coupled to gate terminals of the first memory cells and the second memory cells. A word line driver is configured to apply a first voltage signal to each of the word lines that are coupled to the gate terminals of the first memory cells during a pre-charge phase.

Method of performing programming operation and related memory device

A memory device includes a memory cell array and peripheral circuits. The memory cell array may include one or more first memory cells configured to store first type data, and one or more second memory cells configured to store second type data. The peripheral circuits may be coupled to the memory cell array and configured to perform a first program operation on the one or more first memory cells, perform the first program operation on the one or more second memory cells, and perform a second program operation on the one or more first memory cells. A first storage time corresponding to the first type data is longer than a second storage time corresponding to the second type data.

In a method for reading a memory device including a first memory cell string, in a pre-verify stage, a first verify voltage is applied on a gate terminal of a selected memory cell of the first memory cell string, where the selected memory cell is programmed and arranged between a first adjacent memory cell and a second adjacent memory cell. A first bias voltage is applied on a gate terminal of at least one memory cell of the first memory cell string that is not programmed. In a verify stage, a second verify voltage is applied on the gate terminal of the selected memory cell of the first memory cell string. A second bias voltage is applied on the gate terminal of the at least one memory cell of the first memory cell string that is not programmed, where the second bias voltage is smaller than the first bias voltage.

Architecture and method for NAND memory operation

A memory device may include a first set of word lines in a first zone and a second set of word lines in a second zone. When programming memory cells coupled to a first target word line of the first set of word lines, a first pass voltage may be applied to at least one word line of the first set of word lines. When programming memory cells coupled to a second target word line of the second set of word lines, a second pass voltage may be applied to at least one word line of the second set of word lines. The at least one word line of the first set of word lines and the at least one word line of the second set of word lines have been programmed. The second pass voltage may be higher than the first pass voltage.

Memory including a plurality of portions and used for reducing program disturbance and program method thereof

The present disclosure relates to a three-dimensional memory (3D) and a control method thereof. The 3D memory includes a first deck and a second deck which are stacked in a vertical direction of a substrate. The first deck and the second deck each includes a plurality of memory string. Each memory string includes a plurality of memory cells. The plurality of memory cells includes a first portion and a second portion. A diameter of channel structure corresponding to the first portion of memory cells is smaller than that of channel structure corresponding to the second portion of memory cells. The method includes performing a read operation for selected memory cells that are in at least one of the first deck or the second deck; and applying a pass voltage to non-selected memory cells other than the selected memory cells in the first deck and the second deck. A first pass voltage is lower than a second pass voltage. The first pass voltage is applied to first non-selected memory cells in the first portion, and the second pass voltage is applied to second non-selected memory cells in the second portion.

Three-dimensional memory and control method thereof

A method for operating a memory is disclosed. The memory includes a first group of word lines, a second group of word lines, a first dummy word line, and a second dummy word line. The first dummy word line and the second dummy word line are between the first group of word lines and the second group of word lines. A first pass voltage is applied to the first dummy word line and applying a second pass voltage to the second dummy word line. A program voltage is applied to a selected word line, wherein a condition is met: a first voltage difference between the first pass voltage and a first threshold voltage of a first dummy cell corresponding to the first dummy word line is different from a second voltage difference between the second pass voltage and a second threshold voltage of a second dummy cell corresponding to the second dummy word line.

Method and memory used for reducing program disturbance by adjusting voltage of dummy word line

When programming and verifying a memory device which includes a plurality of memory cells and a plurality of word lines, a first coarse programming is first performed on a first memory cell among the plurality of memory cells which is controlled by a first word line among the plurality of word lines, and then a second coarse programming is performed on a second memory cell among the plurality of memory cells which is controlled by a second word line among the plurality of word lines. Next, a first coarse verify current is used for determining whether the first memory cell passes a coarse verification and a second coarse verify current is used for determining whether the second memory cell passes a second coarse verification, wherein the second coarse verify current is smaller than the first coarse verify current.

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Wuhan, China

XiangNan Zhao