Siliconware Precision Industries Co., Ltd.

Wei-Sheng Lin

Yude Chu

Lien-Chen Chiang

Meng-Hung Yeh

Lung-Tang Hung

Zhi-Lun Hsieh

A method of eliminating a defective bonding wire is provided, including moving a bonding member from a first region of a carrier to a second region of the carrier if the bonding wire of the bonding member is defective, and cooperatively operating a movement member and the bonding member so as to cause the defective bonding wire to be removed from the bonding member and bonded to the second region of the carrier, thereby auto-debugging the bonding member and improving the production efficiency.

Wire bonding device and method of eliminating defective bonding wire

A method for fabricating a wire bonding structure is disclosed, which includes: providing a substrate having a plurality of bonding pads; and foaming a ball end of a bonding wire on at least one of the bonding pads by performing a scrubbing process along a path around a periphery of the bonding pad, thereby preventing delamination of the ball end of small size from the bonding pad.

Method for fabricating wire bonding structure

A lead frame for improving molding reliability and a semiconductor package with the lead frame are proposed. At least one embossed structure, such as a metal bump or recessed portion, is formed on a bonding layer of a wire-bonding area of the lead frame. At least one semiconductor chip is electrically connected to the lead frame via bonding wires bonded to the bonding layer. During a molding process for fabricating an encapsulant to encapsulate the chip, the bonding wires and a portion of the lead frame, the embossed structure makes the bonding layer become uneven and thus increases the contact area and adhesion between the bonding layer and the encapsulant, so as to prevent cracks of the bonding wires and improve the electrical performances and molding reliability.

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Taichung, Taiwan

Wei-Sheng Lin