Silicon Laboratories Inc.

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Justin Dougherty

Martin Joseph Gabriel, Iii

David H Griffin

A test socket () includes first () and second () test leads and a first electrically conductive member (). The first test lead is adapted to contact a first external inductor terminal of an integrated circuit (). The second test lead () is adapted to contact a second external inductor terminal of the integrated circuit (). The first electrically conductive member () extends between the first test lead () and the second test lead (), thereby forming an inductance loop between the first external inductor terminal and the second external inductor terminal.

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Austin, TX, United States of America

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