Kabushiki Kaisha Toshiba

Toshitsune Iijima

Ninao Sato

Isao Ozawa

Naohisa Okumura

Junichi Asada

Katsuhiko Oyama

Hideo Taguchi

Takeshi Kusakabe

Hiroshi Shimoe

Toshikazu Mino

Jun Omori

A method for manufacturing a semiconductor device according to one embodiment of the present invention includes a step of covering a plurality of base plates in which respective semiconductor chips are mounted, by means of a sealing resin such that a plurality of base plates are spaced apart from each other, and a step of cutting the sealing resin between a plurality of base plates.

Method for manufacturing a semiconductor device and a semiconductor device

A semiconductor chip is formed by dividing a semiconductor wafer by use of the laser dicing technique. The semiconductor chip has a laser dicing region on the side surface thereof. A dummy wiring layer is formed along the laser dicing region on the surface layer of the laser dicing region. A laser beam is applied to the dummy wiring layer to divide the semiconductor wafer.

Method of dividing a semiconductor wafer utilizing a laser dicing technique

Semiconductor device obtained by dividing semiconductor wafer by use of laser dicing technique and method of manufacturing the same

A semiconductor package of this invention comprises an electrode pad arranged on a semiconductor chip, a bonding wire, an end of which is coupled to the electrode pad, and a connection pad arranged parallel to a direction of arrangement of the bonding wire, to which another end of the bonding wire is coupled, and a pitch of the connection pad is wider than that of the electrode pad.

Wiring pattern of semiconductor device

Semiconductor device

An IC chip and overhang portions are stuck to tape by an adhesive agent layer having elasticity. A plurality of solder balls are attached to the tape. By soldering the solder balls to a printed board, a semiconductor device is mounted. In the case where a temperature cycle has been caused, thermal stress occurs between the IC chip and the printed board or between the hangover portion and the printed board because of a difference in coefficient of thermal expansion between the IC chip or the hangover portion and the printed board. However, this thermal stress is absorbed by the elasticity of the adhesive agent layer. As a result, little thermal stress is applied to solder balls. Even if the above described temperature cycle is repeated, therefore, the solder balls are electrically connected to the printed board stably over a long period of time. In addition, the area of the tape is widened by the area of the hangover portions. Accordingly, a larger number of solder balls can be attached to the tape without reducing the size of each of the solder balls.

Semiconductor device of surface mounting type and method for fabricating the same

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Tokyo, Japan

Toshitsune Iijima