Kabushiki Kaisha Toshiba

Toshiaki Douzaka

Yutaka Tanaka

Hiroaki Suzuki

Shigeyuki Hayakawa

Kaoru Hama

Tsuyoshi Midorikawa

Kyosuke Ogawa

According to one embodiment, a semiconductor memory device includes a memory cell array in which memory cells are disposed in a matrix, each memory cell being connectable to any one of a plurality of bit lines, and a capacitance that suppresses coupling noise among the plurality of bit lines, the capacitance being added to at least one of the plurality of bit lines.

Semiconductor memory device

A row decoder is disposed on a side of a memory cell array in a column direction and supplies one of word lines with a first drive signal for selecting one of memory cells. A dummy word line is formed extending in the column direction. A dummy bit line is formed extending in a row direction. At least one of the dummy word line and the dummy bit line is disposed outside of the memory cell array. The row decoder outputs a second drive signal toward a sense amplifier circuit via the dummy bit line and the dummy word line.

A photo-mask that includes a first light shielding region which is narrow and elongated, and a second light shielding region which is wider and more elongated than the first light shielding region and is away from the first light shielding region. A phase shifter part and a non-phase shifter part are provided adjacently to both sides of the first light shielding region. Two phase shifter parts or two non-phase shifter parts are respectively provided adjacently to both sides of the second light shielding part.

Photo-mask having phase and non-phase shifter parts for patterning an insulated gate transistor

A fuse-data reading circuit is provided in a semiconductor integrated circuit device. In the fused-data reading circuit, a differential latch circuit compares a current depending on the resistance across a first fuse element, i.e., target element, with a current depending on the resistance of a series circuit including a second fuse element used as a reference fuse element and a resistor element. The differential latch circuit determines whether the first fuse element has been cut or not.

Growing community of inventors

Yokohama, Japan

Toshiaki Douzaka