International Business Machines Corporation

Globalfoundries Inc.

Timothy W Budell

David Brian Stone

Patrick H Buffet

Craig P Lussier

Eric W Tremble

Jean Audet

Alain Caron

William Louis Brodsky

Samuel R Connor

Janak G Patel

Jerzy Maria Zalesinski

Peter Slota, Jr

Ross William Keesler

Matthew Thomas Guzowski

Charles S Chiu

Mark Curtis Hayes Lamorey

Thomas P Comino

Steven G Rosser

Richard Dauphin

Robert Charles Cusimano

Brian P Welch

Todd W Davies

Adam Matthew Bittner

Patrick G Wilder

Esmaeil Rahmati

Douglas Wayne Kemerer

Thomas R Bednar

Paul Lee Clouser

Charles K Erdelyi

David C Reynolds

James V Crain, Jr

Erik Breiland

Donald S Kent

Haitian Hu

Patrick H Buffett

Apparatus and methods for an electronic package incorporating shielding against emissions of electromagnetic interference (EMI). According to an integrated circuit structure, a substrate is on a printed circuit board. An integrated circuit chip is on the substrate. The integrated circuit chip is electrically connected to the substrate. An EMI shielding unit is on the integrated circuit chip and the substrate. The EMI shielding unit comprises a lid covering the integrated circuit chip and portions of the substrate outside the integrated circuit chip. A fill material can be deposited within a cavity formed between the lid and the substrate. The fill material comprises an EMI absorbing material. A periphery of the lid comprises a side skirt, the side skirt circumscribing the integrated circuit chip and the substrate. EMI absorbing material is on the printed circuit board, and a portion of the side skirt is embedded in the EMI absorbing material.

Organic module EMI shielding structures and methods

Apparatus and methods for an electronic package incorporating shielding against emissions of electromagnetic interference (EMI). According to an integrated circuit structure, a substrate is on a printed circuit board. An integrated circuit chip is on the substrate. The integrated circuit chip is electrically connected to the substrate. An electromagnetic interference (EMI) shielding unit is on the integrated circuit chip and the substrate. The EMI shielding unit comprises a lid covering the integrated circuit chip and portions of the substrate outside the integrated circuit chip. A fill material can be deposited within a cavity formed between the lid and the substrate. The fill material comprises an EMI absorbing material. A periphery of the lid comprises a side skirt, the side skirt circumscribing the integrated circuit chip and the substrate. EMI absorbing material is on the printed circuit board, and a portion of the side skirt is embedded in the EMI absorbing material.

In one embodiment, a method for reducing power supply noise within an electronic system that includes an integrated circuit (IC), a package, and a printed circuit board (PCB) connected by a plurality of power delivery networks (PDN) is disclosed. Power supply noise within the system is reduced by defining a voltage compression limit for each PDN of the electronic system; determining a voltage compression for each PDN of the electronic system during a plurality of switching events; comparing the voltage compression of each PDN of the electronic system to the voltage compression limit for each switching event; and in response to the voltage compression of each PDN of the electronic system exceeding the limit, modifying the electronic system to reduce the voltage compression below the limit.

System-level method for reducing power supply noise in an electronic system

A method for modeling bond wires in an IC package for predicting noise effects generated by electromagnetic coupling in complex bond wire configurations. A look-up table of equivalent LC circuit models for the bond wires is generated that accurately predicts the effects of the bond wire circuitry of a signal transmission system. Switch and mirror techniques are applied to reduce the bond wire configurations necessary to simulate. The method includes: setting parameters related to the IC package layout of groups of bond wires; sub-dividing each group of bond wires into regions, each including a portion of the bond wire or its corresponding pad, and generating dissection planes for the regions consisting of the bond wires; performing a 3D simulation on the regions consisting of the corresponding pads, and a 2D simulation for each dissection plane; constructing equivalent circuit models for groups of bond wires and corresponding pads based on the 3D and 2D simulations results; inputting the equivalent circuit models into a circuit simulator to measure the noise effects; and modifying the layout geometry to meet noise targets.

Multi-segments modeling bond wire interconnects with 2D simulations in high speed, high density wire bond packages

An electrical resistance determination method. Input to the method includes a description of at least one electrical network within a substrate. The description includes specification of a plurality of first ports on a first side of the substrate, and a plurality of second ports on a second side of the substrate, for each electrical network. All of the first ports are electrically isolated from one another. All of the second ports are electrically connected to a common voltage. A computer readable program code, which is executed by a processor of a computer system computes for a first electrical network of the at least one electrical network an electrical resistance between each first port and a port of the second ports. The computer code may also display a perspective plot of the computed electrical resistances as a bar oriented about normal to each first port.

Validation of electrical performance of an electronic package prior to fabrication

After finding the shortest conductive signal return-current path for each signal, the invention assesses whether each conductive return-current path is adequate. The method analyzes each shortest conductive signal return-current path and determines if a significant portion of the signal return current flows as displacement current rather than following the conductive current path. A significant displacement current flows when the length of the conductive return-current path that diverges from a signal net is more than a previously defined limit based on the signal transition time. Further, a significant displacement current flows when the overall length of the signal differs from the overall length of the conductive return-current path by more than a previously defined limit based on the signal transition time.

Automatic verification of adequate conductive return-current paths

A system and method for generating simulated wiring connections between a semiconductor device and a carrier. The method comprises identifying a plurality of first factors and instances of each first factor relating to the semiconductor device and identifying a plurality of second factors and instances of each second factor relating to the carrier. The first and second factors are associated with each other on a one-to-one basis. A simulated wiring connection is generated between a first I/O terminal and a matching second I/O terminal, subject to an identified instance of each first factor of each first I/O terminal being correlated to an identified instance of the associated second factor of the matching second I/O terminal. A simulated wiring connection is generated between third I/O terminals located in a first region and fourth I/O terminals located in a second region.

Auto connection assignment system and method

A method, structure, and method of design relating an electrical structure that includes a metal voltage plane laminated to a dielectric substrate. A determination is made as to where to place an opening for venting gases generated during fabrication of the dielectric laminate. An identification is made of a problematic opening in the metal voltage plane that is above or below a corresponding metal signal line within the dielectric laminate, such that an image of a portion of the corresponding metal signal line projects across the problematic opening. An electrically conductive strip is positioned across the problematic opening, such that the strip includes the image. In fabrication, the dielectric substrate having the metal signal line therein is provided. The metal voltage plane is laminated to the dielectric substrate. The opening in the metal voltage plane is formed such that the strip is across the opening and includes the image.

Vents with signal image for signal return path

A system and method for generating simulated wiring connections between first I/O terminals of a semiconductor device and second I/O terminals of a carrier. The method comprises identifying a plurality of first factors and instances of each first factor relating to a semiconductor device and identifying a plurality of second factors and instances of each second factor relating to a carrier. The first and second factors are associated with each other on a one-to-one basis. The instances of each first factor are correlated to the instances of each associated second factor on a one-to-one basis. A simulated wiring connection automatically is generated between each first I/O terminal and a matching second I/O terminal, subject to an identified instance of each first factor of each first I/O terminal being correlated to an identified instance of the associated second factor of the matching second I/O terminal.

An electronic device, including: a plurality of contacts pads on a surface of a substrate; the contacts pads spaced apart a first predetermined distance in a first direction; and the contact pads spaced apart a second predetermined distance in a second direction, the first predetermined distance different from the second predetermined distance, the first direction perpendicular to the second direction.

Dual pitch contact pad footprint for flip-chip chips and modules

The invention relates generally to a method of power supply noise and signal integrity analysis for creating frequency-dependent electrical models particularly related to microelectronic packages. The method discloses creation of equivalent circuits for geometries encountered in a typical chip package, including how to partition the geometry into cells which are less then 1/20 the minimum wavelength (&#x3bb;) in size, and how to handle signal and power supply vias, signal wires, and power planes. The method also instructs how to assign values to each of the inductors, capacitors, resistors, and transmission lines in each equivalent circuit. The method further provides modeling of only those interactions which occur between adjacent cells.

Hierarchical method of power supply noise and signal integrity analysis

An integrated circuit chip having a contact layer that includes a plurality of Vdd, Vddx, ground and I/O contacts arranged in a generally radial pattern having diagonal and major axis symmetry and generally defining four quadrants. A multilayer X-Y power grid is located beneath the contact layer. A wiring layer is interposed between the contact layer and power grid to provide a well-behaved electrical transition between the generally radial Vdd, Vddx and ground contacts and the rectangular X-Y power grid. The interposed wiring layer includes concentric square rings of Vdd, Vddx and ground wires located alternatingly with one another. The Vddx wires are discontinuous between adjacent quadrants so that the magnitude of Vddx may be different in each quadrant of the chip if desired.

Integrated circuit chip having a ringed wiring layer interposed between a contact layer and a wiring grid

The present invention relates to a method for optimization of a signal wire structure, providing concurrent optimization of a plurality of wire parameters, providing a plurality of wiring solutions, wherein each of said wiring solutions produces a wiring package having different wire parameters, providing an electronic package, determining the optimal wiring solutions for said electronic package; and producing an electronic package, using the optimized wiring package solutions. The resulting apparatus is also disclosed.

Growing community of inventors

Milton, VT, United States of America

Timothy W Budell