Xilinx, Inc.

Tien-Yu Lee

Jaspreet Singh Gandhi

Suresh Ramalingam

Gamal Refai-Ahmed

Ivor G Barber

Henley Liu

Mohsen Hossein Mardi

Myongseob Kim

Cheang-Whang Chang

Ferdinand F Fernandez

Rafael C Camarota

Inderjit Singh

David M Mahoney

Nael Zohni

Yu Hsiang Sun

A chip package assembly and method for fabricating the same are provided which utilize a plurality of extra-die heat transfer posts for improved thermal management. In one example, a chip package assembly is provided that includes a first integrated circuit (IC) die mounted to a substrate, a cover disposed over the first IC die, and a plurality of extra-die conductive posts disposed between the cover and substrate. The extra-die conductive posts provide a heat transfer path between the cover and substrate that is laterally outward of the first IC die.

Stacked silicon package assembly having thermal management

A chip package assembly having robust solder connections are described herein. In one example, a chip package assembly is provided that includes an integrated circuit (IC) die and a package substrate. Solder pads are arranged to connect to pillars of the IC die via solder connections. Solder resist in the corners of the package substrate and surrounding the solder connections may be inhibited from cracking isolating the portion of the solder resist surrounding the solder pads and/or by providing an offset between centerlines of the pillars and solder pads.

Chip package assembly with enhanced solder resist crack resistance

An integrated circuit assembly having an improved solder connection, and methods for fabricating the same are provided that utilize platelets within the solder connections to inhibit solder connection failure, thus providing a more robust solder interface. In one example, an integrated circuit assembly is provided that includes a package substrate having a first plurality of contact pads exposed on a first surface of the package substrate and a second plurality of contact pads exposed on a second surface of the package substrate. The second plurality of contact pads have a pitch that is greater than a pitch of the first plurality of contact pads. Interconnect circuitry is disposed in the package substrate and couples the first and second pluralities of contact pads. At least a first contact pad of the second plurality of contact pads includes a solder ball disposed directly in contact with a palladium layer.

Solder joints for board level reliability

Methods and apparatus are described for heat management in an integrated circuit (IC) package using a lid with recessed areas in the inner surfaces of the lid. The recessed areas (e.g., trenches) provide receptacles for accepting a portion of a thermal interface material (TIM) that may be forced out when the lid is positioned on the TIM above one or more integrated circuit (IC) dies during fabrication of the IC package. In this manner, the TIM bond line thickness (BLT) between the lid and the IC die(s) may be reduced for decreased thermal resistance, but sufficient interfacial adhesion is provided for the IC package with such a lid to avoid TIM delamination.

Methods and apparatus for thermal interface material (TIM) bond line thickness (BLT) reduction and TIM adhesion enhancement for efficient thermal management

Integrated (IC) package testing systems and methods for testing an IC package are provided herein that accommodate IC packages having different die heights. In one example, the IC package testing system includes a test fixture base, a socket, and a test fixture head. The socket is disposed on the test fixture base and configured to receive an IC package for testing. The test fixture head is movable towards and away from the base. The test fixture head includes a base plate and a plurality of independently movable pushers. The plurality of pushers are configured to engage the IC package disposed the socket.

Testing system for lid-less integrated circuit packages

An integrated circuit interconnects are described herein that are suitable for forming integrated circuit chip packages. In one example, an integrated circuit interconnect is provided that includes a package substrate having a plurality of solder balls coupled to a plurality of contact pads. The package substrate includes a solder mask having a plurality of stepped openings, a plurality of contact pads, and circuitry disposed in the package substrate and coupled to the plurality of contact pads. The solder mask defines a top side of the package substrate. The stepped openings expose the contact pads through solder mask.

Chip package assembly with enhanced interconnects and method for fabricating the same

An example clamping assembly tray for packaging a semiconductor device includes a frame having a bottom surface and side walls extending from the bottom surface that define a cavity; and a compressible member disposed on the bottom surface of the frame within the cavity, where a top portion of the compressible member provides a support surface for supporting the semiconductor device, the support surface being between the bottom surface and a top edge of the side walls.

Method and apparatus for assembling and testing a multi-integrated circuit package

A method and apparatus are provided which improve heat transfer between a lid and an IC die of an IC (chip) package. In one embodiment, a chip package is provided that includes a first IC die, a package substrate, a lid and a stiffener. The first IC die is coupled to the package substrate. The stiffener is coupled to the package substrate and circumscribes the first IC die. The lid has a first surface and a second surface. The second surface faces away from the first surface and towards the first IC die. The second surface of the lid is conductively coupled to the IC die, while the lid is mechanically decoupled from the stiffener.

Stacked silicon package assembly having an enhanced lid

An apparatus includes a package substrate for a first SSIT product with a first top die configuration, wherein the package substrate is compatible with a second SSIT product with a second top die configuration, and wherein the first top die configuration is different from the second top die configuration.

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San Jose, CA, United States of America

Tien-Yu Lee