Tokyo Ohka Kogyo Co., Ltd.

Omnivision Technologies, Inc.

Takuma Hasegawa

Yoshihiro Inao

Koki Tamura

Yasushi Fujii

Shigeru Yokoi

Atsuo Kajima

Image sensors having reduced dark current and white pixel are disclosed herein. In one embodiment, each pixel of the image sensor includes a photodiode (PD), a first floating diffusion (FD) coupled to the photodiode through a transfer (TX) transistor, a second floating diffusion (FD) coupled to the FDthrough a dual floating diffusion (DFD) transistor, and a lateral overflow integrating capacitor (LOFIC) coupled between the FDand a variable reference voltage (VCAP). A method for a correlated double sampling (CDS) readout includes: exposing a photodiode (PD) to light during an exposure period and increasing a capacitance of the LOFIC by setting the VCAP to a high voltage (H) level during an integration period of the exposure period.

Dark current/white pixel devices and methods for lateral overflow image sensors

A bonding method including an adhesive layer forming process in which a thermoplastic adhesive is applied to a substrate or a support plate and an adhesive layer is formed; a heating process in which the adhesive layer that is formed on the substrate or the support plate is heated; and a bonding process in which the substrate and the support plate are pressed against each other via the heated adhesive layer, thereby bonding the substrate and the support plate.

Processing method and processing apparatus

A stage is provided on which is mounted a substrate that has a concavo-convex portion such as a circuit formed on the underside thereof. A channelthrough which a coolant such as water flows is formed in a stage. An annular flange portionis formed on the top surface of the stage. The inner side of the flange portionforms a concave portion. The top surface of the flange portionis provided with a smooth finish in order to mount a peripheral section of the underside of a substrate W thereon. Holes through which are passed three positioning pinsand lift pinsare provided in the flange portionat regular intervals in the circumferential direction.

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Kawasaki, Japan

Takuma Hasegawa