Samsung Electronics Co., Ltd.

Sungkyu Jo

Jinyub Lee

A memory device includes a cell region including a plurality of word lines, a plurality of bit lines, and a plurality of memory cells connected to the plurality of word lines and the plurality of bit lines disposed therein, where each of the plurality of memory cells includes a switch element and a memory element connected to each other in series between a corresponding word line and a corresponding bit line, and a peripheral circuit region including a control logic configured to, when a read command for a selected memory cell among the memory cells is received from an external controller, input a pre-voltage to the selected memory cell before reading data of the selected memory cell. The control logic is configured to determine a level of the pre-voltage with reference to an elapsed time after programming of the selected memory cell.

Memory device

A memory device includes a cell area in which a plurality of word lines, a plurality of bit lines, and a plurality of memory cells connected to the plurality of word lines and the plurality of bit lines are disposed, each of the plurality of memory cells including an Ovonic threshold switch element and a memory element connected to each other in series, and a peripheral circuit area including at least one peripheral circuit, configured to input a first refresh voltage turning on the Ovonic threshold switch element to each of at least some refresh cells among the plurality of memory cells to execute a refresh operation, determine each of the refresh cells as a first refresh cell in a first state or a second refresh cell in a second state while the Ovonic threshold switch element is turned on, and input a second refresh voltage, different to the first refresh voltage, to the second refresh cell.

Memory device including an ovonic threshold switch element and a method of operating thereof

A memory device includes: a cell array connected to a plurality of word lines and bit lines, the cell array including a plurality of memory cells each including a variable resistance element and a bidirectional selection element; a selection circuit that selects a selected word line and a selected bit line; and control logic that controls the selection circuit such that in a stand-by state, wherein the word lines and the bit lines which are connected to memory cells of a first area of the cell array are maintained in a discharge state, and the word lines and bit lines which are connected to memory cells of a second area of the cell array are maintained in a precharge state.

Variable resistance memory device including bidirectional switch, memory system including the same, and operating method thereof

A memory system is provided which includes a nonvolatile memory; and a controller configured to control the nonvolatile memory, wherein the controller comprises a voltage detector configured to detect a level of a power supply voltage; and wherein when a level of the power supply voltage is lower than a first threshold value, the controller issues a reset command to the nonvolatile memory and then performs a reset operation.

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Hwaseong-si, South Korea

Sungkyu Jo