Intel Corporation

Sudipto Naskar

Manish Chandhok

Kevin Lai Lin

Abhishek A Sharma

Scott Bruce Clendenning

Roman Caudillo

Cheyun Lin

Tahir Ghani

Willy Rachmady

Hui Jae Yoo

Richard E Schenker

Rami Hourani

Miriam Ruth Reshotko

Stephanie A Bojarski

Ryan Pearce

Christopher Parker

Gilbert W Dewey

Marko Radosavljevic

Patrick R Morrow

Biswajeet Guha

Charles Henry Wallace

Cheng-Ying Huang

Nicole K Thomas

William Hsu

Marie Krysak

Tristan A Tronic

Satyarth Suri

Urusa Alaan

Bruce E Beattie

Jeffery D Bielefeld

Jasmeet S Chawla

Colin T Carver

Jessica M Torres

Mohammad Hasan

Nita Chandrasekhar

Prashant Wadhwa

Michael Makowski

Minyoung Lee

Shashi Vyas

Hsin-Fen Li

Jianqiang Lin

An integrated circuit structure having a stacked transistor architecture includes a first semiconductor body (e.g., set of one or more nanoribbons) and a second semiconductor body (e.g., set of one or more nanoribbons) above the first semiconductor body. The first and second semiconductor bodies are part of the same fin structure. The distance between an upper surface of the first semiconductor body and a lower surface of the second semiconductor body is 60 nm or less. A first gate structure is on the first semiconductor body, and a second gate structure is on the second semiconductor body. An isolation structure that includes a dielectric material is between the first and second gate structures, and is on and conformal to a top surface of the first gate structure. In addition, a bottom surface of the second gate structure is on a top surface of the isolation structure, which is relatively flat.

Gate-to-gate isolation for stacked transistor architecture via selective dielectric deposition structure

Embodiments herein describe techniques for a semiconductor device including a three dimensional capacitor. The three dimensional capacitor includes a pole, and one or more capacitor units stacked around the pole. A capacitor unit of the one or more capacitor units includes a first electrode surrounding and coupled to the pole, a dielectric layer surrounding the first electrode, and a second electrode surrounding the dielectric layer. Other embodiments may be described and/or claimed.

Capacitor architectures in semiconductor devices

An integrated circuit structure includes a first interconnect level including a first dielectric between a pair of interconnect structures, a second interconnect level above the first interconnect level. The second interconnect level includes a cap structure including a second dielectric on the first dielectric, the cap structure includes a top surface and a sidewall surface and a liner comprising a third dielectric on the top surface and on the sidewall surface.

Cap structure for interconnect dielectrics and methods of fabrication

A transistor includes a first channel layer over a second channel layer, an epitaxial source structure coupled to a first end of the first and second channel layers and an epitaxial drain structure coupled to a second end of the first and second channel layers. The transistor includes a gate between the epitaxial source structure and the epitaxial drain structure, where the gate is above the first channel layer and between the first channel layer and the second channel layer. The transistor includes a first spacer of a first material, between the first and second channel layers includes. The first spacer has at least one convex sidewall that is between the gate and the epitaxial source structure and between the gate and the epitaxial drain structure. The transistor also includes a second spacer of a second material having substantially vertical sidewalls above the first channel layer.

Localized spacer for nanowire transistors and methods of fabrication

Transistors structures comprising a semiconductor features and dielectric material comprising silicon and oxygen in gaps or spaces between the features. The dielectric material may fill the gaps from bottom-up with an atomic layer deposition (ALD) process that includes a silicon deposition phase, and an oxidation phase augmented by N:NHplasma activated nitrogen species. Being plasma activated, the nitrogen species have short mean free paths, and therefore preferentially passivate surfaces with low aspect ratios. This aspect-ratio dependent passivation may increase an energy barrier to surface reactions with a silicon precursor, resulting in a concomitant differential in deposition rate. With N:NHplasma passivation, deposited dielectric material may have a nitrogen concentration that varies by at least order of magnitude as a function of the aspect ratio of the filled gaps.

Gap fill dielectrics for electrical isolation of transistor structures in the manufacture of integrated circuits

Gate-all-around integrated circuit structures fabricated using alternate etch selective material, and the resulting structures, are described. For example, an integrated circuit structure includes a vertical arrangement of horizontal nanowires. A gate stack is over the vertical arrangement of horizontal nanowires. A pair of dielectric spacers is along sides of the gate stack and over the vertical arrangement of horizontal nanowires. A metal oxide material is between adjacent ones of the vertical arrangement of horizontal nanowires at a location between the pair of dielectric spacers and the sides of the gate stack.

Gate-all-around integrated circuit structures fabricated using alternate etch selective material

Embodiments include an interconnect structure and methods of forming such an interconnect structure. In an embodiment, the interconnect structure comprises a first interlayer dielectric (ILD) and a first interconnect layer with a plurality of first conductive traces partially embedded in the first ILD. In an embodiment, an etch stop layer is formed over surfaces of the first ILD and sidewall surfaces of the first conductive traces. In an embodiment, the interconnect structure further comprises a second interconnect layer that includes a plurality of second conductive traces. In an embodiment, a via between the first interconnect layer and the second interconnect layer may be self-aligned with the first interconnect layer.

Grating replication using helmets and topographically-selective deposition

Passivating silicide-based approaches for conductive via fabrication is described. In an example, an integrated circuit structure includes a plurality of conductive lines in an inter-layer dielectric (ILD) layer above a substrate. Each of the plurality of conductive lines is recessed relative to an uppermost surface of the ILD layer. A metal silicide layer is on the plurality of conductive lines, in recess regions above each of the plurality of conductive lines. A hardmask layer is on the metal silicide layer and on the uppermost surface of the ILD layer. A conductive via is in an opening in the hardmask layer and on a portion of the metal silicide layer on one of the plurality of conductive lines.

Passivating silicide-based approaches for conductive via fabrication and structures resulting therefrom

An integrated circuit die, a semiconductor structure, and a method of fabricating the semiconductor structure are disclosed. The integrated circuit die includes a substrate and a first anchor and a second anchor disposed on the substrate in a first plane. The integrated circuit die also includes a first wire disposed on the first anchor in the first plane, a third wire disposed on the second anchor in the first plane, and a second wire and a fourth wire suspended above the substrate in the first plane. The second wire is disposed between the first wire and the third wire and the third wire is disposed between the second wire and the fourth wire. The integrated circuit die further includes a dielectric material disposed between upper portions of the first wire, the second wire, the third wire, and the fourth wire to encapsulate an air gap.

Pitch quartered three-dimensional air gaps

An embodiment includes a dielectric material; a trench included in the dielectric material, the trench having first and second opposing sidewalls; wherein the trench includes: (a)(i) a first trench portion extending from the first sidewall to the second sidewall, (a)(ii) a second trench portion extending from the first sidewall to the second sidewall, and (a)(iii) a third trench portion extending from the first sidewall to the second sidewall; wherein the second trench portion is between the first trench portion and the third trench portion; wherein the first trench portion is substantially filled with a first material, the second trench portion is substantially filled with a second material, and the third trench portion is substantially filled with a third material; wherein (b)(i) the first material includes nitrogen, and (b)(ii) the first material includes more nitrogen than the third material. Other embodiments are described herein.

Nitrogen assisted oxide gapfill

A plurality of interconnect features are formed in an interconnect layer on a first insulating layer on a substrate. An opening in the first insulating layer is formed through at least one of the interconnect features. A gap fill layer is deposited in the opening.

Self-aligned via below subtractively patterned interconnect

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Portland, OR, United States of America

Sudipto Naskar